Leakage in Nanometer CMOS Technologies -Methodologies for Power Gating

Kimiyoshi Usami, Takayasu Sakurai, 16 more authors.

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)77-104
JournalDefault journal
Publication statusPublished - 2006 Oct 1

Cite this

Leakage in Nanometer CMOS Technologies -Methodologies for Power Gating. / Usami, Kimiyoshi; Sakurai, Takayasu; authors., 16 more.

In: Default journal, 01.10.2006, p. 77-104.

Research output: Contribution to journalArticle

Usami, Kimiyoshi ; Sakurai, Takayasu ; authors., 16 more. / Leakage in Nanometer CMOS Technologies -Methodologies for Power Gating. In: Default journal. 2006 ; pp. 77-104.
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