Abstract
The straddle fatigue test has been performed to study the fatigue properties of Sn-1.2 mass%Ag-0.5 mass%Cu-0.05 mass%Ni for flip chip interconnections. The low cycle fatigue resistance of the alloy is equivalent to that of Sn-3mass%Ag-0.5mass%Cu alloy, even though the fatigue endurance of Sn-1 mass%Ag-0.5 mass%Cu alloy was poorer than that of the 3 mass%Ag alloy. The alloy has fine microstructure and Ag3Sn intermetallic compound makes a network structure together with fine (Cu.Ni)6Sn5 compound. The microstructure resulted in high cyclic strain hardening exponents, which leaded to good low cycle fatigue endurance of the alloy.
Original language | English |
---|---|
Pages (from-to) | 689-694 |
Number of pages | 6 |
Journal | Materials Transactions |
Volume | 45 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2004 Mar |
Externally published | Yes |
Keywords
- Ball grid Array (BGA) joints
- Fatigue life
- Flip chip
- Lead-free solder
- Low silver content
- Nickel addition
- Shear fatigue
- Tin-silver-copper
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering