Low temperature scanning force microscopy using piezoresistive cantilevers

P. Meiser, Michael Rudolf Koblischka, U. Hartmann

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

Original languageEnglish
Article number085903
JournalMeasurement Science and Technology
Volume26
Issue number8
DOIs
Publication statusPublished - 2015 Aug 1
Externally publishedYes

Fingerprint

Atomic force microscopy
microscopes
microscopy
Microscopes
scanning
ferromagnetic materials
magnetic force microscopy
levitation
superconducting films
cryogenic temperature
magnetite
Temperature
Superconducting films
Ferromagnetic materials
magnetic flux
Magnetite
Magnetic flux
Cryogenics
Lead
room temperature

Keywords

  • domain patterns
  • low-temperature MFM
  • magnetite films
  • piezoresistive cantilevers
  • superconductors

ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

Cite this

Low temperature scanning force microscopy using piezoresistive cantilevers. / Meiser, P.; Koblischka, Michael Rudolf; Hartmann, U.

In: Measurement Science and Technology, Vol. 26, No. 8, 085903, 01.08.2015.

Research output: Contribution to journalArticle

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