Low temperature scanning force microscopy using piezoresistive cantilevers

P. Meiser, M. R. Koblischka, U. Hartmann

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

Original languageEnglish
Article number085903
JournalMeasurement Science and Technology
Issue number8
Publication statusPublished - 2015 Aug 1
Externally publishedYes


  • domain patterns
  • low-temperature MFM
  • magnetite films
  • piezoresistive cantilevers
  • superconductors

ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics


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