Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

M.Iwanami M.Iwanami, E.Yamazaki E.Yamazaki, K.Nakano K.Nakano, T.Sudo T.Sudo, S.Haga S.Haga, S.Hoshino S.Hoshino, S.Wakana S.Wakana, M.Kishi M.Kishi, M.Tsuchiya M.Tsuchiya, Toshio Sudo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)155-160
JournalICEMC 2002
Publication statusPublished - 2002 Oct 15

Cite this

M.Iwanami, M. I., E.Yamazaki, E. Y., K.Nakano, K. N., T.Sudo, T. S., S.Haga, S. H., S.Hoshino, S. H., S.Wakana, S. W., M.Kishi, M. K., M.Tsuchiya, M. T., & Sudo, T. (2002). Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe, ICEMC 2002, 155-160.