Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

M.Iwanami M.Iwanami, E.Yamazaki E.Yamazaki, K.Nakano K.Nakano, T.Sudo T.Sudo, S.Haga S.Haga, S.Hoshino S.Hoshino, S.Wakana S.Wakana, M.Kishi M.Kishi, M.Tsuchiya M.Tsuchiya, Toshio Sudo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)155-160
JournalICEMC 2002
Publication statusPublished - 2002 Oct 15

Cite this

M.Iwanami, M. I., E.Yamazaki, E. Y., K.Nakano, K. N., T.Sudo, T. S., S.Haga, S. H., S.Hoshino, S. H., ... Sudo, T. (2002). Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe, ICEMC 2002, 155-160.