Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe

Mizuki Iwanami, Etsushi Yamazaki, Ken Nakano, Toshio Sudo, Shigeki Hoshino, Shinichi Wakana, Masato Kishi, Masahiro Tsuchiya

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.

Original languageEnglish
Pages (from-to)3273-3281
Number of pages9
JournalJournal of Lightwave Technology
Volume21
Issue number12
DOIs
Publication statusPublished - 2003 Dec

Fingerprint

Magnetooptical effects
integrated circuits
Integrated circuits
near fields
fibers
Fibers
probes
power supplies
electromagnetic interference
output
printed circuits
electric field strength
circuit boards
Radiation
radiation sources
fiber optics
Signal interference
Electric power systems
spatial resolution
Printed circuit boards

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Iwanami, M., Yamazaki, E., Nakano, K., Sudo, T., Hoshino, S., Wakana, S., ... Tsuchiya, M. (2003). Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe. Journal of Lightwave Technology, 21(12), 3273-3281. https://doi.org/10.1109/JLT.2003.820047

Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe. / Iwanami, Mizuki; Yamazaki, Etsushi; Nakano, Ken; Sudo, Toshio; Hoshino, Shigeki; Wakana, Shinichi; Kishi, Masato; Tsuchiya, Masahiro.

In: Journal of Lightwave Technology, Vol. 21, No. 12, 12.2003, p. 3273-3281.

Research output: Contribution to journalArticle

Iwanami, M, Yamazaki, E, Nakano, K, Sudo, T, Hoshino, S, Wakana, S, Kishi, M & Tsuchiya, M 2003, 'Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe', Journal of Lightwave Technology, vol. 21, no. 12, pp. 3273-3281. https://doi.org/10.1109/JLT.2003.820047
Iwanami, Mizuki ; Yamazaki, Etsushi ; Nakano, Ken ; Sudo, Toshio ; Hoshino, Shigeki ; Wakana, Shinichi ; Kishi, Masato ; Tsuchiya, Masahiro. / Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe. In: Journal of Lightwave Technology. 2003 ; Vol. 21, No. 12. pp. 3273-3281.
@article{61826253ec834d14bdcfc5beb77dfb51,
title = "Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe",
abstract = "To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.",
author = "Mizuki Iwanami and Etsushi Yamazaki and Ken Nakano and Toshio Sudo and Shigeki Hoshino and Shinichi Wakana and Masato Kishi and Masahiro Tsuchiya",
year = "2003",
month = "12",
doi = "10.1109/JLT.2003.820047",
language = "English",
volume = "21",
pages = "3273--3281",
journal = "Journal of Lightwave Technology",
issn = "0733-8724",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "12",

}

TY - JOUR

T1 - Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe

AU - Iwanami, Mizuki

AU - Yamazaki, Etsushi

AU - Nakano, Ken

AU - Sudo, Toshio

AU - Hoshino, Shigeki

AU - Wakana, Shinichi

AU - Kishi, Masato

AU - Tsuchiya, Masahiro

PY - 2003/12

Y1 - 2003/12

N2 - To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.

AB - To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.

UR - http://www.scopus.com/inward/record.url?scp=4544291541&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4544291541&partnerID=8YFLogxK

U2 - 10.1109/JLT.2003.820047

DO - 10.1109/JLT.2003.820047

M3 - Article

VL - 21

SP - 3273

EP - 3281

JO - Journal of Lightwave Technology

JF - Journal of Lightwave Technology

SN - 0733-8724

IS - 12

ER -