Abstract
To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.
| Original language | English |
|---|---|
| Pages (from-to) | 3273-3281 |
| Number of pages | 9 |
| Journal | Journal of Lightwave Technology |
| Volume | 21 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 2003 Dec |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
Cite this
Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe. / Iwanami, Mizuki; Yamazaki, Etsushi; Nakano, Ken; Sudo, Toshio; Hoshino, Shigeki; Wakana, Shinichi; Kishi, Masato; Tsuchiya, Masahiro.
In: Journal of Lightwave Technology, Vol. 21, No. 12, 12.2003, p. 3273-3281.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe
AU - Iwanami, Mizuki
AU - Yamazaki, Etsushi
AU - Nakano, Ken
AU - Sudo, Toshio
AU - Hoshino, Shigeki
AU - Wakana, Shinichi
AU - Kishi, Masato
AU - Tsuchiya, Masahiro
PY - 2003/12
Y1 - 2003/12
N2 - To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.
AB - To establish a method for investigating hidden radiation sources and their mechanisms in a printed circuit board, we performed preliminary measurements of one-dimensional magnetic near-field distribution over pins of a large-scale integrated circuit (LSI) package by means of an optical method: the fiber-edge magnetooptic (FEMO) probing technique. The FEMO probe consists of fiber optics and a magnetooptic crystal glued at a fiber edge. Its planar spatial resolution is approximately 100 μm. It was found that a magnetic field generated from each LSI pin could be distinguished and some radiation was generated from ground and power supply lines. We compared the measured results with corresponding radiated electric field strength that was separately measured. The frequency of interest was the tenth harmonic of the output signal. We observed a strong correlation between those two experimental results, which suggests the effectiveness of our proposed method for near-field investigation. One of the beneficial features of the FEMO probe is its small probe head, due to which one can perform detailed near-field evaluations in a microscopic region. Furthermore, we tried to specify a major electromagnetic interference source by additional measurements of near-field distributions and frequency dependence of magnetooptic signals. It was suggested that the short-through current flowing in the power-supply system of the input/output circuits caused high-level radiated emission.
UR - http://www.scopus.com/inward/record.url?scp=4544291541&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=4544291541&partnerID=8YFLogxK
U2 - 10.1109/JLT.2003.820047
DO - 10.1109/JLT.2003.820047
M3 - Article
AN - SCOPUS:4544291541
VL - 21
SP - 3273
EP - 3281
JO - Journal of Lightwave Technology
JF - Journal of Lightwave Technology
SN - 0733-8724
IS - 12
ER -