Mapping of phase distribution in electron holography with a stage-scanning system

Dan Lei; K. Mitsuishi; K. Harada; M. Shimojo; Dongying Ju; M. Takeguchi

doi:10.4028/www.scientific.net/MSF.750.152

Mapping of phase distribution in electron holography with a stage-scanning system

Dan Lei, K. Mitsuishi, K. Harada, M. Shimojo, Dongying Ju, M. Takeguchi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

Original language	English
Title of host publication	Advanced Materials Science and Technology
Pages	152-155
Number of pages	4
DOIs	https://doi.org/10.4028/www.scientific.net/MSF.750.152
Publication status	Published - 2013 Apr 10
Event	8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan Duration: 2012 Aug 1 → 2012 Aug 4

Publication series

Name	Materials Science Forum
Volume	750
ISSN (Print)	0255-5476

Conference

Conference	8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
Country	Japan
City	Fukuoka City
Period	12/8/1 → 12/8/4

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Keywords

Electron holography
Phase distribution
Stage scan

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

Lei, D., Mitsuishi, K., Harada, K., Shimojo, M., Ju, D., & Takeguchi, M. (2013). Mapping of phase distribution in electron holography with a stage-scanning system. In Advanced Materials Science and Technology (pp. 152-155). (Materials Science Forum; Vol. 750). https://doi.org/10.4028/www.scientific.net/MSF.750.152

Lei, D, Mitsuishi, K, Harada, K, Shimojo, M, Ju, D & Takeguchi, M 2013, Mapping of phase distribution in electron holography with a stage-scanning system. in Advanced Materials Science and Technology. Materials Science Forum, vol. 750, pp. 152-155, 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012, Fukuoka City, Japan, 12/8/1. https://doi.org/10.4028/www.scientific.net/MSF.750.152

@inproceedings{a57a4d40ffe04b199bc59fe261b4a338,

title = "Mapping of phase distribution in electron holography with a stage-scanning system",

abstract = "A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.",

keywords = "Electron holography, Phase distribution, Stage scan",

author = "Dan Lei and K. Mitsuishi and K. Harada and M. Shimojo and Dongying Ju and M. Takeguchi",

year = "2013",

month = apr

day = "10",

doi = "10.4028/www.scientific.net/MSF.750.152",

language = "English",

isbn = "9783037856604",

series = "Materials Science Forum",

pages = "152--155",

booktitle = "Advanced Materials Science and Technology",

note = "8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 ; Conference date: 01-08-2012 Through 04-08-2012",

}

TY - GEN

T1 - Mapping of phase distribution in electron holography with a stage-scanning system

AU - Lei, Dan

AU - Mitsuishi, K.

AU - Harada, K.

AU - Shimojo, M.

AU - Ju, Dongying

AU - Takeguchi, M.

PY - 2013/4/10

Y1 - 2013/4/10

N2 - A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

AB - A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

KW - Electron holography

KW - Phase distribution

KW - Stage scan

UR - http://www.scopus.com/inward/record.url?scp=84875818490&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875818490&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/MSF.750.152

DO - 10.4028/www.scientific.net/MSF.750.152

M3 - Conference contribution

AN - SCOPUS:84875818490

SN - 9783037856604

T3 - Materials Science Forum

SP - 152

EP - 155

BT - Advanced Materials Science and Technology

T2 - 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012

Y2 - 1 August 2012 through 4 August 2012

ER -

Access to Document

10.4028/www.scientific.net/MSF.750.152