Abstract
A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.
| Original language | English |
|---|---|
| Title of host publication | Advanced Materials Science and Technology |
| Pages | 152-155 |
| Number of pages | 4 |
| DOIs | |
| Publication status | Published - 2013 Apr 10 |
| Event | 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan Duration: 2012 Aug 1 → 2012 Aug 4 |
Publication series
| Name | Materials Science Forum |
|---|---|
| Volume | 750 |
| ISSN (Print) | 0255-5476 |
Conference
| Conference | 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 |
|---|---|
| Country | Japan |
| City | Fukuoka City |
| Period | 12/8/1 → 12/8/4 |
Keywords
- Electron holography
- Phase distribution
- Stage scan
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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Cite this
Lei, D., Mitsuishi, K., Harada, K., Shimojo, M., Ju, D., & Takeguchi, M. (2013). Mapping of phase distribution in electron holography with a stage-scanning system. In Advanced Materials Science and Technology (pp. 152-155). (Materials Science Forum; Vol. 750). https://doi.org/10.4028/www.scientific.net/MSF.750.152