Mapping of phase distribution in electron holography with a stage-scanning system

Dan Lei, K. Mitsuishi, K. Harada, M. Shimojo, Dongying Ju, M. Takeguchi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

Original languageEnglish
Title of host publicationAdvanced Materials Science and Technology
PublisherTrans Tech Publications Ltd
Pages152-155
Number of pages4
ISBN (Print)9783037856604
DOIs
Publication statusPublished - 2013
Event8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan
Duration: 2012 Aug 1 → 2012 Aug 4

Publication series

NameMaterials Science Forum
Volume750
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
CountryJapan
CityFukuoka City
Period12/8/1 → 12/8/4

Keywords

  • Electron holography
  • Phase distribution
  • Stage scan

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Lei, D., Mitsuishi, K., Harada, K., Shimojo, M., Ju, D., & Takeguchi, M. (2013). Mapping of phase distribution in electron holography with a stage-scanning system. In Advanced Materials Science and Technology (pp. 152-155). (Materials Science Forum; Vol. 750). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.750.152