Abstract
A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.
| Original language | English |
|---|---|
| Title of host publication | Materials Science Forum |
| Pages | 152-155 |
| Number of pages | 4 |
| Volume | 750 |
| DOIs | |
| Publication status | Published - 2013 |
| Event | 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City Duration: 2012 Aug 1 → 2012 Aug 4 |
Publication series
| Name | Materials Science Forum |
|---|---|
| Volume | 750 |
| ISSN (Print) | 02555476 |
Other
| Other | 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 |
|---|---|
| City | Fukuoka City |
| Period | 12/8/1 → 12/8/4 |
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Keywords
- Electron holography
- Phase distribution
- Stage scan
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanical Engineering
- Mechanics of Materials
Cite this
Mapping of phase distribution in electron holography with a stage-scanning system. / Lei, Dan; Mitsuishi, K.; Harada, K.; Shimojo, Masayuki; Ju, Dongying; Takeguchi, M.
Materials Science Forum. Vol. 750 2013. p. 152-155 (Materials Science Forum; Vol. 750).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Mapping of phase distribution in electron holography with a stage-scanning system
AU - Lei, Dan
AU - Mitsuishi, K.
AU - Harada, K.
AU - Shimojo, Masayuki
AU - Ju, Dongying
AU - Takeguchi, M.
PY - 2013
Y1 - 2013
N2 - A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.
AB - A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.
KW - Electron holography
KW - Phase distribution
KW - Stage scan
UR - http://www.scopus.com/inward/record.url?scp=84875818490&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84875818490&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.750.152
DO - 10.4028/www.scientific.net/MSF.750.152
M3 - Conference contribution
AN - SCOPUS:84875818490
SN - 9783037856604
VL - 750
T3 - Materials Science Forum
SP - 152
EP - 155
BT - Materials Science Forum
ER -