Measurement of TFT/LCD flicker for ISO compliance

Ryoji Yoshitake, Rieko Kataoka

Research output: Contribution to journalArticle

Abstract

Flicker is one of the major concerns in the design of computer display, and there have been many research reports on measuring and predicting flicker in order to provide users with flicker-free displays. Most of the previous studies, however, have been based on CRT displays. In this study, flicker on a thin-film transistor liquid crystal display (TFT/LCD) was measured by using a subjective evaluation method. The purpose of the study was to ascertain whether the TFT/LCD conform to ISO standards on flicker, and to determine the main factors affecting flicker on the TFT/LCD. The results indicate that the TFT/LCD used in the study met the ISO standards at frame frequency as low as 35 Hz when all-pixels-on patterns were displayed. It was found that the common voltage (Vcom) is one of the most important factors affecting flicker on the TFT/LCD, and that the Vcom should be well-balanced to make the TFT/LCD flicker-free. It was also found that the analytic method proposed in ISO/CD 13406-2 was not always appropriate for predicting flicker on the TFT/LCD.

Original languageEnglish
Pages (from-to)661-666
Number of pages6
JournalAdvances in Human Factors/Ergonomics
Volume20
Issue numberB
DOIs
Publication statusPublished - 1995
Externally publishedYes

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Thin film transistors
Liquid crystal displays
Display devices
CD
Cathode ray tubes
Compliance
Pixels
Electric potential
evaluation

ASJC Scopus subject areas

  • Social Sciences (miscellaneous)
  • Human Factors and Ergonomics

Cite this

Measurement of TFT/LCD flicker for ISO compliance. / Yoshitake, Ryoji; Kataoka, Rieko.

In: Advances in Human Factors/Ergonomics, Vol. 20, No. B, 1995, p. 661-666.

Research output: Contribution to journalArticle

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