Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Yoshinori Dobashi; Takashi Ijiri; Hideki Todo; Kei Iwasaki; Makoto Okabe; Satoshi Nishimura

doi:10.1145/2945078.2945106

Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Yoshinori Dobashi, Takashi Ijiri, Hideki Todo, Kei Iwasaki, Makoto Okabe, Satoshi Nishimura

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

Original language	English
Title of host publication	SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters
Publisher	Association for Computing Machinery, Inc
ISBN (Electronic)	9781450343718
DOIs	https://doi.org/10.1145/2945078.2945106
Publication status	Published - 2016 Jul 24
Externally published	Yes
Event	ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016 - Anaheim, United States Duration: 2016 Jul 24 → 2016 Jul 28

Publication series

Name	SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters

Other

Other	ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016
Country/Territory	United States
City	Anaheim
Period	16/7/24 → 16/7/28

Keywords

BRDF
Laser microscopy
Microstructures

ASJC Scopus subject areas

Computer Graphics and Computer-Aided Design
Human-Computer Interaction
Software

Access to Document

10.1145/2945078.2945106

Cite this

Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. / Dobashi, Yoshinori; Ijiri, Takashi; Todo, Hideki; Iwasaki, Kei; Okabe, Makoto; Nishimura, Satoshi.

SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters. Association for Computing Machinery, Inc, 2016. a28 (SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Dobashi, Y, Ijiri, T, Todo, H, Iwasaki, K, Okabe, M & Nishimura, S 2016, Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. in SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters., a28, SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters, Association for Computing Machinery, Inc, ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016, Anaheim, United States, 16/7/24. https://doi.org/10.1145/2945078.2945106

@inproceedings{f0cc9efdd122407daf1fc01342b47bac,

title = "Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness",

abstract = "Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.",

keywords = "BRDF, Laser microscopy, Microstructures",

author = "Yoshinori Dobashi and Takashi Ijiri and Hideki Todo and Kei Iwasaki and Makoto Okabe and Satoshi Nishimura",

note = "Copyright: Copyright 2017 Elsevier B.V., All rights reserved.; ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016 ; Conference date: 24-07-2016 Through 28-07-2016",

year = "2016",

month = jul,

day = "24",

doi = "10.1145/2945078.2945106",

language = "English",

series = "SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters",

publisher = "Association for Computing Machinery, Inc",

booktitle = "SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters",

}

TY - GEN

T1 - Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

AU - Dobashi, Yoshinori

AU - Ijiri, Takashi

AU - Todo, Hideki

AU - Iwasaki, Kei

AU - Okabe, Makoto

AU - Nishimura, Satoshi

PY - 2016/7/24

Y1 - 2016/7/24

N2 - Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

AB - Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

KW - BRDF

KW - Laser microscopy

KW - Microstructures

UR - http://www.scopus.com/inward/record.url?scp=84986000707&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84986000707&partnerID=8YFLogxK

U2 - 10.1145/2945078.2945106

DO - 10.1145/2945078.2945106

M3 - Conference contribution

AN - SCOPUS:84986000707

T3 - SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters

BT - SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters

PB - Association for Computing Machinery, Inc

T2 - ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016

Y2 - 24 July 2016 through 28 July 2016

ER -

Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Abstract

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Keywords

ASJC Scopus subject areas

Access to Document

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