Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Yoshinori Dobashi, Takashi Ijiri, Hideki Todo, Kei Iwasaki, Makoto Okabe, Satoshi Nishimura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

Original languageEnglish
Title of host publicationSIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters
PublisherAssociation for Computing Machinery, Inc
ISBN (Electronic)9781450343718
DOIs
Publication statusPublished - 2016 Jul 24
Externally publishedYes
EventACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016 - Anaheim, United States
Duration: 2016 Jul 242016 Jul 28

Other

OtherACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016
CountryUnited States
CityAnaheim
Period16/7/2416/7/28

Fingerprint

Distribution functions
Microscopic examination
Surface roughness
Scanning
Microstructure
Lasers
Normal distribution
Computer graphics

Keywords

  • BRDF
  • Laser microscopy
  • Microstructures

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Human-Computer Interaction
  • Software

Cite this

Dobashi, Y., Ijiri, T., Todo, H., Iwasaki, K., Okabe, M., & Nishimura, S. (2016). Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. In SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters [a28] Association for Computing Machinery, Inc. https://doi.org/10.1145/2945078.2945106

Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. / Dobashi, Yoshinori; Ijiri, Takashi; Todo, Hideki; Iwasaki, Kei; Okabe, Makoto; Nishimura, Satoshi.

SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters. Association for Computing Machinery, Inc, 2016. a28.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dobashi, Y, Ijiri, T, Todo, H, Iwasaki, K, Okabe, M & Nishimura, S 2016, Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. in SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters., a28, Association for Computing Machinery, Inc, ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016, Anaheim, United States, 16/7/24. https://doi.org/10.1145/2945078.2945106
Dobashi Y, Ijiri T, Todo H, Iwasaki K, Okabe M, Nishimura S. Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. In SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters. Association for Computing Machinery, Inc. 2016. a28 https://doi.org/10.1145/2945078.2945106
Dobashi, Yoshinori ; Ijiri, Takashi ; Todo, Hideki ; Iwasaki, Kei ; Okabe, Makoto ; Nishimura, Satoshi. / Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters. Association for Computing Machinery, Inc, 2016.
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