Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Yoshinori Dobashi; Takashi Ijiri; Hideki Todo; Kei Iwasaki; Makoto Okabe; Satoshi Nishimura

doi:10.1145/2945078.2945106

Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Yoshinori Dobashi, Takashi Ijiri, Hideki Todo, Kei Iwasaki, Makoto Okabe, Satoshi Nishimura

Department of Computer Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

Original language	English
Title of host publication	SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters
Publisher	Association for Computing Machinery, Inc
ISBN (Electronic)	9781450343718
DOIs	https://doi.org/10.1145/2945078.2945106
Publication status	Published - 2016 Jul 24
Event	ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016 - Anaheim, United States Duration: 2016 Jul 24 → 2016 Jul 28

Publication series

Name	SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters

Other

Other	ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016
Country	United States
City	Anaheim
Period	16/7/24 → 16/7/28

Fingerprint

Keywords

BRDF
Laser microscopy
Microstructures

ASJC Scopus subject areas

Computer Graphics and Computer-Aided Design
Human-Computer Interaction
Software

Cite this

Dobashi, Y., Ijiri, T., Todo, H., Iwasaki, K., Okabe, M., & Nishimura, S. (2016). Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. In SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters [a28] (SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters). Association for Computing Machinery, Inc. https://doi.org/10.1145/2945078.2945106

Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. / Dobashi, Yoshinori; Ijiri, Takashi; Todo, Hideki; Iwasaki, Kei; Okabe, Makoto; Nishimura, Satoshi.

SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters. Association for Computing Machinery, Inc, 2016. a28 (SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Dobashi, Y, Ijiri, T, Todo, H, Iwasaki, K, Okabe, M & Nishimura, S 2016, Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. in SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters., a28, SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters, Association for Computing Machinery, Inc, ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016, Anaheim, United States, 16/7/24. https://doi.org/10.1145/2945078.2945106

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Access to Document

10.1145/2945078.2945106