Original language | English |
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Pages (from-to) | Th-P48 |
Journal | Default journal |
Publication status | Published - 1998 Sep 1 |
Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate
Y. Hayashi, H. Ishikawa, T. Egawa, T. Soga, T. Jimbo, M .Umeno
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)