Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate

Y. Hayashi, H. Ishikawa, T. Egawa, T. Soga, T. Jimbo, M .Umeno

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)Th-P48
JournalDefault journal
Publication statusPublished - 1998 Sep 1

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