Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate

Y. Hayashi, H. Ishikawa, T. Egawa, T. Soga, T. Jimbo, M .Umeno

Research output: Contribution to journal › Article › peer-review

Cite this

@article{11b7825662934cfa88a0e432687ae489,

title = "Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate",

author = "Y. Hayashi and H. Ishikawa and T. Egawa and T. Soga and T. Jimbo and M .Umeno",

year = "1998",

month = sep,

day = "1",

language = "English",

pages = "Th--P48",

journal = "Default journal",

}