Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate

Y. Hayashi, H. Ishikawa, T. Egawa, T. Soga, T. Jimbo, M .Umeno

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)Th-P48
JournalDefault journal
Publication statusPublished - 1998 Sep 1

Cite this

Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate. / Hayashi, Y.; Ishikawa, H.; Egawa, T.; Soga, T.; Jimbo, T.; .Umeno, M.

In: Default journal, 01.09.1998, p. Th-P48.

Research output: Contribution to journalArticle

@article{11b7825662934cfa88a0e432687ae489,
title = "Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate",
author = "Y. Hayashi and H. Ishikawa and T. Egawa and T. Soga and T. Jimbo and M .Umeno",
year = "1998",
month = "9",
day = "1",
language = "English",
pages = "Th--P48",
journal = "Default journal",

}

TY - JOUR

T1 - Micro-Raman Scattering Study of Internal Strain Relaxation in Post-Growth Patterned GaN Film Grown on Sapphire Substrate

AU - Hayashi, Y.

AU - Ishikawa, H.

AU - Egawa, T.

AU - Soga, T.

AU - Jimbo, T.

AU - .Umeno, M

PY - 1998/9/1

Y1 - 1998/9/1

M3 - Article

SP - Th-P48

JO - Default journal

JF - Default journal

ER -