Abstract
Radioactive spent solvent waste containing U and Pu is generated from reprocessing process of spent nuclear fuel. The nuclear materials removal is important for safety storage or disposal. Imino diacetic acid (IDA) type chelating resin is promising adsorbent, and its characterization is performed by Particle Induced X-ray Emission (PIXE) and Extended X-ray Absorption Fine Structure (EXAFS) analyses on Zr in order to evaluate adsorption mechanism. PIXE succeeded in quantitative analysis on few microgram of adsorbed Zr, and EXAFS suggested that Zr in the aqueous solution and in the solvent can be trapped by IDA group with different mechanisms.
Original language | English |
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Pages (from-to) | 54-59 |
Number of pages | 6 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 477 |
DOIs | |
Publication status | Published - 2020 Aug 15 |
Keywords
- Chelating resin
- EXAFS
- Micro-PIXE
- Spent solvent
- Zr recovery
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation