Microstructure and Fatigue Damage of Eutectic Bi-Sn Alloy at High Temperature

T. Sato, Y. K, a a, Y. Kariya

Research output: Contribution to journalArticle

Original languageEnglish
JournalProc. Of International Conference on Electronics Materials and Packaging
VolumeEMAP2011
Publication statusPublished - 2011 Dec 1

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