Microstructure and flux pinning of reacted-and-pressed, polycrystalline Ba0.6K0.4Fe2As2 powders

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Abstract

The flux pinning properties of reacted-and-pressed Ba0.6K0.4Fe2As2 powder were measured using magnetic hysteresis loops in the temperature range 20 K ≤ T ≤ 35 K. The scaling analysis of the flux pinning forces (Fp = jc × B, with jc denoting the critical current density) following the Dew-Hughes model reveals a dominant flux pinning provided by normal-conducting point defects (δl-pinning) with only small irreversibility fields, Hirr, ranging between 0.5 T (35 K) and 16 T (20 K). Kramer plots demonstrate a linear behavior above an applied field of 0.6 T. The samples were further characterized by electron backscatter diffraction (EBSD) analysis to elucidate the origin of the flux pinning. We compare our data with results of Weiss et al. (bulks) and Yao et al. (tapes), revealing that the dominant flux pinning in the samples for applications is provided mainly by grain boundary pinning, created by the densification procedures and the mechanical deformation applied.

Original languageEnglish
Article number2173
JournalMaterials
Volume12
Issue number13
DOIs
Publication statusPublished - 2019 Jul 1

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Flux pinning
Powders
Microstructure
Magnetic hysteresis
Point defects
Hysteresis loops
Densification
Electron diffraction
Tapes
Grain boundaries

Keywords

  • Critical currents
  • Flux pinning
  • Iron-based superconductors
  • Microstructure

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

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title = "Microstructure and flux pinning of reacted-and-pressed, polycrystalline Ba0.6K0.4Fe2As2 powders",
abstract = "The flux pinning properties of reacted-and-pressed Ba0.6K0.4Fe2As2 powder were measured using magnetic hysteresis loops in the temperature range 20 K ≤ T ≤ 35 K. The scaling analysis of the flux pinning forces (Fp = jc × B, with jc denoting the critical current density) following the Dew-Hughes model reveals a dominant flux pinning provided by normal-conducting point defects (δl-pinning) with only small irreversibility fields, Hirr, ranging between 0.5 T (35 K) and 16 T (20 K). Kramer plots demonstrate a linear behavior above an applied field of 0.6 T. The samples were further characterized by electron backscatter diffraction (EBSD) analysis to elucidate the origin of the flux pinning. We compare our data with results of Weiss et al. (bulks) and Yao et al. (tapes), revealing that the dominant flux pinning in the samples for applications is provided mainly by grain boundary pinning, created by the densification procedures and the mechanical deformation applied.",
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author = "Koblischka, {Michael Rudolf} and Koblischka-Veneva, {Anjela Dimitrova} and J{\"o}rg Schmauch and Masato Murakami",
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AU - Koblischka, Michael Rudolf

AU - Koblischka-Veneva, Anjela Dimitrova

AU - Schmauch, Jörg

AU - Murakami, Masato

PY - 2019/7/1

Y1 - 2019/7/1

N2 - The flux pinning properties of reacted-and-pressed Ba0.6K0.4Fe2As2 powder were measured using magnetic hysteresis loops in the temperature range 20 K ≤ T ≤ 35 K. The scaling analysis of the flux pinning forces (Fp = jc × B, with jc denoting the critical current density) following the Dew-Hughes model reveals a dominant flux pinning provided by normal-conducting point defects (δl-pinning) with only small irreversibility fields, Hirr, ranging between 0.5 T (35 K) and 16 T (20 K). Kramer plots demonstrate a linear behavior above an applied field of 0.6 T. The samples were further characterized by electron backscatter diffraction (EBSD) analysis to elucidate the origin of the flux pinning. We compare our data with results of Weiss et al. (bulks) and Yao et al. (tapes), revealing that the dominant flux pinning in the samples for applications is provided mainly by grain boundary pinning, created by the densification procedures and the mechanical deformation applied.

AB - The flux pinning properties of reacted-and-pressed Ba0.6K0.4Fe2As2 powder were measured using magnetic hysteresis loops in the temperature range 20 K ≤ T ≤ 35 K. The scaling analysis of the flux pinning forces (Fp = jc × B, with jc denoting the critical current density) following the Dew-Hughes model reveals a dominant flux pinning provided by normal-conducting point defects (δl-pinning) with only small irreversibility fields, Hirr, ranging between 0.5 T (35 K) and 16 T (20 K). Kramer plots demonstrate a linear behavior above an applied field of 0.6 T. The samples were further characterized by electron backscatter diffraction (EBSD) analysis to elucidate the origin of the flux pinning. We compare our data with results of Weiss et al. (bulks) and Yao et al. (tapes), revealing that the dominant flux pinning in the samples for applications is provided mainly by grain boundary pinning, created by the densification procedures and the mechanical deformation applied.

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