Microstructure and optical properties of Sm 3+ doped TiO 2 thin films by oblique angle deposition

Xiudi Xiao; Lei Miao; Gang Xu; Jianda Shao; Zhengxiu Fan

doi:10.1080/10584587.2011.576950

Microstructure and optical properties of Sm ³⁺ doped TiO ₂ thin films by oblique angle deposition

Xiudi Xiao, Lei Miao, Gang Xu, Jianda Shao, Zhengxiu Fan

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Abstract

TiO ₂: 2%Sm ³⁺ thin films were prepared by oblique angle deposition. X-ray diffraction (XRD), scanning electron microscope (SEM), UV-Vis-NIR spectrophotometer, fluorescence spectrophotometer was employed to characterize the structure and optical properties of TiO ₂: 2%Sm ³⁺ thin films. The results indicated that these thin films were with anisotropic columnar structure before and after calcination. The optical anisotropy measured by transmission difference (Tp-Ts) at 500nm was increasing from 8% to 33% with calcination. Under ultraviolet excitation (?ex =330nm) and commercial 365nm UV lamp excitation, these TiO ₂: Sm ³⁺ thin films show intense 4G5/2→ ⁶H _{5/2, 7/2, 9/2} emissions of Sm ³⁺. The polarized photoluminescence was anticipated in the anisotropic thin films.

Original language	English
Pages (from-to)	201-207
Number of pages	7
Journal	Integrated Ferroelectrics
Volume	129
Issue number	1
DOIs	https://doi.org/10.1080/10584587.2011.576950
Publication status	Published - 2011
Externally published	Yes
Event	9th Chinese International Nanoscience and Technology Symposium and the Nano-Products Exposition - Xian, China Duration: 2010 Nov 15 → 2010 Nov 19

Keywords

Anistropy
Photoluminescence
TiO Sm STF

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Control and Systems Engineering
Ceramics and Composites
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Access to Document

10.1080/10584587.2011.576950

Fingerprint Dive into the research topics of 'Microstructure and optical properties of Sm <sup>3+</sup> doped TiO <sub>2</sub> thin films by oblique angle deposition'. Together they form a unique fingerprint.

Cite this

@article{a9a38b05d8804e149b73e6eceaed61b1,

title = "Microstructure and optical properties of Sm 3+ doped TiO 2 thin films by oblique angle deposition",

abstract = "TiO 2: 2%Sm 3+ thin films were prepared by oblique angle deposition. X-ray diffraction (XRD), scanning electron microscope (SEM), UV-Vis-NIR spectrophotometer, fluorescence spectrophotometer was employed to characterize the structure and optical properties of TiO 2: 2%Sm 3+ thin films. The results indicated that these thin films were with anisotropic columnar structure before and after calcination. The optical anisotropy measured by transmission difference (Tp-Ts) at 500nm was increasing from 8% to 33% with calcination. Under ultraviolet excitation (?ex =330nm) and commercial 365nm UV lamp excitation, these TiO 2: Sm 3+ thin films show intense 4G5/2→ 6H 5/2, 7/2, 9/2 emissions of Sm 3+. The polarized photoluminescence was anticipated in the anisotropic thin films.",

keywords = "Anistropy, Photoluminescence, TiO Sm STF",

author = "Xiudi Xiao and Lei Miao and Gang Xu and Jianda Shao and Zhengxiu Fan",

note = "Funding Information: This work was founded by the National Natural Science Foundation of China (No 60778026) and the Shanghai Rising-Star Program (No 07QB14006). Copyright: Copyright 2012 Elsevier B.V., All rights reserved.; 9th Chinese International Nanoscience and Technology Symposium and the Nano-Products Exposition ; Conference date: 15-11-2010 Through 19-11-2010",

year = "2011",

doi = "10.1080/10584587.2011.576950",

language = "English",

volume = "129",

pages = "201--207",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

number = "1",

}

TY - JOUR

T1 - Microstructure and optical properties of Sm 3+ doped TiO 2 thin films by oblique angle deposition

AU - Xiao, Xiudi

AU - Miao, Lei

AU - Xu, Gang

AU - Shao, Jianda

AU - Fan, Zhengxiu

N1 - Funding Information: This work was founded by the National Natural Science Foundation of China (No 60778026) and the Shanghai Rising-Star Program (No 07QB14006). Copyright: Copyright 2012 Elsevier B.V., All rights reserved.

PY - 2011

Y1 - 2011

N2 - TiO 2: 2%Sm 3+ thin films were prepared by oblique angle deposition. X-ray diffraction (XRD), scanning electron microscope (SEM), UV-Vis-NIR spectrophotometer, fluorescence spectrophotometer was employed to characterize the structure and optical properties of TiO 2: 2%Sm 3+ thin films. The results indicated that these thin films were with anisotropic columnar structure before and after calcination. The optical anisotropy measured by transmission difference (Tp-Ts) at 500nm was increasing from 8% to 33% with calcination. Under ultraviolet excitation (?ex =330nm) and commercial 365nm UV lamp excitation, these TiO 2: Sm 3+ thin films show intense 4G5/2→ 6H 5/2, 7/2, 9/2 emissions of Sm 3+. The polarized photoluminescence was anticipated in the anisotropic thin films.

AB - TiO 2: 2%Sm 3+ thin films were prepared by oblique angle deposition. X-ray diffraction (XRD), scanning electron microscope (SEM), UV-Vis-NIR spectrophotometer, fluorescence spectrophotometer was employed to characterize the structure and optical properties of TiO 2: 2%Sm 3+ thin films. The results indicated that these thin films were with anisotropic columnar structure before and after calcination. The optical anisotropy measured by transmission difference (Tp-Ts) at 500nm was increasing from 8% to 33% with calcination. Under ultraviolet excitation (?ex =330nm) and commercial 365nm UV lamp excitation, these TiO 2: Sm 3+ thin films show intense 4G5/2→ 6H 5/2, 7/2, 9/2 emissions of Sm 3+. The polarized photoluminescence was anticipated in the anisotropic thin films.

KW - Anistropy

KW - Photoluminescence

KW - TiO Sm STF

UR - http://www.scopus.com/inward/record.url?scp=84858063962&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84858063962&partnerID=8YFLogxK

U2 - 10.1080/10584587.2011.576950

DO - 10.1080/10584587.2011.576950

M3 - Conference article

AN - SCOPUS:84858063962

VL - 129

SP - 201

EP - 207

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

SN - 1058-4587

IS - 1

T2 - 9th Chinese International Nanoscience and Technology Symposium and the Nano-Products Exposition

Y2 - 15 November 2010 through 19 November 2010

ER -