Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, S. Murphy, S. K. Arora, F. Mücklich, U. Hartmann, I. V. Shvets

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

Original languageEnglish
Article number07E505
JournalJournal of Applied Physics
Volume103
Issue number7
DOIs
Publication statusPublished - 2008 Apr 24
Externally publishedYes

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magnetite
thin films
diffraction
electrons
thick films
film thickness
spatial resolution
annealing
air
cross sections
defects

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Murphy, S.; Arora, S. K.; Mücklich, F.; Hartmann, U.; Shvets, I. V.

In: Journal of Applied Physics, Vol. 103, No. 7, 07E505, 24.04.2008.

Research output: Contribution to journalArticle

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AU - Murphy, S.

AU - Arora, S. K.

AU - Mücklich, F.

AU - Hartmann, U.

AU - Shvets, I. V.

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