Microwave irradiation on a-axis oriented Y123/Pr123 two-stacked Josephson junctions device

S. Saini, Paolo Mele, M. Mukaida, S. J. Kim

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Two-stacked submicron Josephson junctions devices were fabricated in a-axis oriented YBaCu3O7 and PrBa2Cu3O7 (Y123/Pr123) multi layered thin films using focused ion beam milling technique. The transition temperature and critical current density (Jc) of the device are about 83 K and 5 × 105 A/cm2 at 20 K, respectively. The device was irradiated with external microwave of 10 GHz and studied at 20 K. The microwave induced voltage steps are observed in I-V characteristics. The supercurrent branch become resistive above a certain microwave power and also the Jc was suppressed as we increased the microwave power. Magnetic field modulation of critical current shows periodicity of about 2000 gauss correspond to the Josephson junctions in the stack.

Original languageEnglish
Pages (from-to)569-573
Number of pages5
JournalCurrent Applied Physics
Volume15
Issue number5
DOIs
Publication statusPublished - 2015 Jan 1
Externally publishedYes

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Keywords

  • Focused ion beam
  • Josephson junctions
  • Microwave irradiation
  • Multi-layered thin films
  • PrBaCuO thin films
  • Pulse laser deposition
  • Two-stacked device
  • YBaCuO thin films

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy(all)

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