Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, J. D. Wei, Y. Zhou, S. Murphy, F. Mücklich, U. Hartmann, I. V. Shvets

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.

Original languageEnglish
Article number09M507
JournalJournal of Applied Physics
Volume101
Issue number9
DOIs
Publication statusPublished - 2007 May 22
Externally publishedYes

Fingerprint

magnetic force microscopy
misalignment
magnetite
thin films
spatial resolution
diffraction
annealing
electrons
high resolution
magnetic domains
ceramics
magnetic properties
air

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Wei, J. D.; Zhou, Y.; Murphy, S.; Mücklich, F.; Hartmann, U.; Shvets, I. V.

In: Journal of Applied Physics, Vol. 101, No. 9, 09M507, 22.05.2007.

Research output: Contribution to journalArticle

@article{181ed90aa58c43f5a541ef1729a4d221,
title = "Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy",
abstract = "Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.",
author = "Koblischka-Veneva, {Anjela Dimitrova} and Koblischka, {Michael Rudolf} and Wei, {J. D.} and Y. Zhou and S. Murphy and F. M{\"u}cklich and U. Hartmann and Shvets, {I. V.}",
year = "2007",
month = "5",
day = "22",
doi = "10.1063/1.2709424",
language = "English",
volume = "101",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "9",

}

TY - JOUR

T1 - Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy

AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Wei, J. D.

AU - Zhou, Y.

AU - Murphy, S.

AU - Mücklich, F.

AU - Hartmann, U.

AU - Shvets, I. V.

PY - 2007/5/22

Y1 - 2007/5/22

N2 - Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.

AB - Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.

UR - http://www.scopus.com/inward/record.url?scp=34248531480&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34248531480&partnerID=8YFLogxK

U2 - 10.1063/1.2709424

DO - 10.1063/1.2709424

M3 - Article

AN - SCOPUS:34248531480

VL - 101

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 9

M1 - 09M507

ER -