Abstract
Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.
| Original language | English |
|---|---|
| Article number | 09M507 |
| Journal | Journal of Applied Physics |
| Volume | 101 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 2007 May 22 |
| Externally published | Yes |
Fingerprint
ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Wei, J. D.; Zhou, Y.; Murphy, S.; Mücklich, F.; Hartmann, U.; Shvets, I. V.
In: Journal of Applied Physics, Vol. 101, No. 9, 09M507, 22.05.2007.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy
AU - Koblischka-Veneva, Anjela Dimitrova
AU - Koblischka, Michael Rudolf
AU - Wei, J. D.
AU - Zhou, Y.
AU - Murphy, S.
AU - Mücklich, F.
AU - Hartmann, U.
AU - Shvets, I. V.
PY - 2007/5/22
Y1 - 2007/5/22
N2 - Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.
AB - Magnetite thin films grown on [001] oriented MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that misoriented grains remaining after the annealing step form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.
UR - http://www.scopus.com/inward/record.url?scp=34248531480&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34248531480&partnerID=8YFLogxK
U2 - 10.1063/1.2709424
DO - 10.1063/1.2709424
M3 - Article
VL - 101
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 9
M1 - 09M507
ER -