Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips,

T.Sudo T.Sudo, K.Nakano K.Nakano, S.Haga S.Haga, Toshio Sudo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)503-506
JournalEMC Europe
Publication statusPublished - 2002 Sep 15

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