Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips,

T.Sudo T.Sudo, K.Nakano K.Nakano, S.Haga S.Haga, Toshio Sudo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)503-506
JournalEMC Europe
Publication statusPublished - 2002 Sep 15

Cite this

T.Sudo, T. S., K.Nakano, K. N., S.Haga, S. H., & Sudo, T. (2002). Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips, EMC Europe, 503-506.