| Original language | English |
|---|---|
| Pages (from-to) | 503-506 |
| Journal | EMC Europe |
| Publication status | Published - 2002 Sept 15 |
Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips,
T.Sudo T.Sudo, K.Nakano K.Nakano, S.Haga S.Haga, Toshio Sudo
Research output: Contribution to journal › Article › peer-review