Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips,

T.Sudo T.Sudo, K.Nakano K.Nakano, S.Haga S.Haga, Toshio Sudo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)503-506
JournalEMC Europe
Publication statusPublished - 2002 Sep 15

Cite this

T.Sudo, T. S., K.Nakano, K. N., S.Haga, S. H., & Sudo, T. (2002). Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips, EMC Europe, 503-506.

Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips, / T.Sudo, T.Sudo; K.Nakano, K.Nakano; S.Haga, S.Haga; Sudo, Toshio.

In: EMC Europe, 15.09.2002, p. 503-506.

Research output: Contribution to journalArticle

T.Sudo, TS, K.Nakano, KN, S.Haga, SH & Sudo, T 2002, 'Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips,', EMC Europe, pp. 503-506.
T.Sudo TS, K.Nakano KN, S.Haga SH, Sudo T. Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips, EMC Europe. 2002 Sep 15;503-506.
T.Sudo, T.Sudo ; K.Nakano, K.Nakano ; S.Haga, S.Haga ; Sudo, Toshio. / Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips,. In: EMC Europe. 2002 ; pp. 503-506.
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