| Original language | English |
|---|---|
| Pages (from-to) | 503-506 |
| Journal | EMC Europe 2002 |
| Publication status | Published - 2002 Sep 10 |
Cite this
Sudo, T., nakano, K., & Haga, S. (2002). Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips. EMC Europe 2002, 503-506.