Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips

T. Sudo, K. nakano, S. Haga

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)503-506
JournalEMC Europe 2002
Publication statusPublished - 2002 Sep 10

Cite this

Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips. / Sudo, T.; nakano, K.; Haga, S.

In: EMC Europe 2002, 10.09.2002, p. 503-506.

Research output: Contribution to journalArticle

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