| Original language | English |
|---|---|
| Pages (from-to) | 503-506 |
| Journal | EMC Europe 2002 |
| Publication status | Published - 2002 Sep 10 |
Cite this
Sudo, T., nakano, K., & Haga, S. (2002). Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips. EMC Europe 2002, 503-506.
Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips. / Sudo, T.; nakano, K.; Haga, S.
In: EMC Europe 2002, 10.09.2002, p. 503-506.Research output: Contribution to journal › Article
Sudo, T, nakano, K & Haga, S 2002, 'Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips', EMC Europe 2002, pp. 503-506.
Sudo T, nakano K, Haga S. Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips. EMC Europe 2002. 2002 Sep 10;503-506.
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author = "T. Sudo and K. nakano and S. Haga",
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