| Original language | English |
|---|---|
| Pages (from-to) | 503-506 |
| Journal | EMC Europe 2002 |
| Publication status | Published - 2002 Sep 10 |
Modeling and Characterization of Switching Noise and Signal Waveforms using Test Chips
T. Sudo, K. nakano, S. Haga
Research output: Contribution to journal › Article › peer-review