Modification of structural and optical properties of silica glass induced by ion microbeam

Hiroyuki Nishikawa, M. Murai, T. Nakamura, Y. Ohki, M. Oikawa, T. Sato, T. Sakai, Y. Ishii, M. Fukuda

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Structural and optical properties of silica glass induced by ion microbeam irradiation were studied using micro- photoluminescence (μ-PL) spectroscopy and atomic force microscopy (AFM). Ion microbeam irradiation was performed using microbeam lines of 3-MV single-ended or tandem accelerators with various ion species including H+, He+, B3+, C4+, N4+, O4+, and Si5+ at energies of 1.7 to 18 MeV. The beam was focused to about 1 μm and was scanned over the surface of high-purity silica glass with fluences of 1013 to 1018 ions/cm2. The μ-PL spectrum in microbeam-irradiated silica shows two peaks at 540 and 650 nm. The mapping of the two PL bands reveals the distribution of defects induced along the track of ions. The compaction was observed in the form of groove at the surface of silica glass by AFM. The depth of the surface groove increases with increasing ion fluence and saturates at about several hundreds to 900 nm, depending on irradiated ion species. The mechanisms of structural and optical modifications of silica glass are can be understood in terms of energy loss due to electronic stopping and nuclear stopping powers. Refractive index changes with an order of 10- 4 to 10- 2 were estimated by a Lorentz-Lorenz relationship from the compaction. Technological implications of these results are also to be discussed.

Original languageEnglish
Pages (from-to)8185-8189
Number of pages5
JournalSurface and Coatings Technology
Volume201
Issue number19-20 SPEC. ISS.
DOIs
Publication statusPublished - 2007 Aug 5

Fingerprint

microbeams
silica glass
Fused silica
Structural properties
Optical properties
Ions
optical properties
Ion bombardment
ions
Atomic force microscopy
Compaction
grooves
Photoluminescence spectroscopy
fluence
atomic force microscopy
Silicon Dioxide
Nuclear energy
Particle accelerators
irradiation
Refractive index

Keywords

  • Atomic force microscopy
  • Ion microbeam
  • Photoluminescence
  • Refractive index
  • Silica glass

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Nishikawa, H., Murai, M., Nakamura, T., Ohki, Y., Oikawa, M., Sato, T., ... Fukuda, M. (2007). Modification of structural and optical properties of silica glass induced by ion microbeam. Surface and Coatings Technology, 201(19-20 SPEC. ISS.), 8185-8189. https://doi.org/10.1016/j.surfcoat.2006.12.031

Modification of structural and optical properties of silica glass induced by ion microbeam. / Nishikawa, Hiroyuki; Murai, M.; Nakamura, T.; Ohki, Y.; Oikawa, M.; Sato, T.; Sakai, T.; Ishii, Y.; Fukuda, M.

In: Surface and Coatings Technology, Vol. 201, No. 19-20 SPEC. ISS., 05.08.2007, p. 8185-8189.

Research output: Contribution to journalArticle

Nishikawa, H, Murai, M, Nakamura, T, Ohki, Y, Oikawa, M, Sato, T, Sakai, T, Ishii, Y & Fukuda, M 2007, 'Modification of structural and optical properties of silica glass induced by ion microbeam', Surface and Coatings Technology, vol. 201, no. 19-20 SPEC. ISS., pp. 8185-8189. https://doi.org/10.1016/j.surfcoat.2006.12.031
Nishikawa, Hiroyuki ; Murai, M. ; Nakamura, T. ; Ohki, Y. ; Oikawa, M. ; Sato, T. ; Sakai, T. ; Ishii, Y. ; Fukuda, M. / Modification of structural and optical properties of silica glass induced by ion microbeam. In: Surface and Coatings Technology. 2007 ; Vol. 201, No. 19-20 SPEC. ISS. pp. 8185-8189.
@article{64a6c6e4b6ac4be89eb8c988c45a3215,
title = "Modification of structural and optical properties of silica glass induced by ion microbeam",
abstract = "Structural and optical properties of silica glass induced by ion microbeam irradiation were studied using micro- photoluminescence (μ-PL) spectroscopy and atomic force microscopy (AFM). Ion microbeam irradiation was performed using microbeam lines of 3-MV single-ended or tandem accelerators with various ion species including H+, He+, B3+, C4+, N4+, O4+, and Si5+ at energies of 1.7 to 18 MeV. The beam was focused to about 1 μm and was scanned over the surface of high-purity silica glass with fluences of 1013 to 1018 ions/cm2. The μ-PL spectrum in microbeam-irradiated silica shows two peaks at 540 and 650 nm. The mapping of the two PL bands reveals the distribution of defects induced along the track of ions. The compaction was observed in the form of groove at the surface of silica glass by AFM. The depth of the surface groove increases with increasing ion fluence and saturates at about several hundreds to 900 nm, depending on irradiated ion species. The mechanisms of structural and optical modifications of silica glass are can be understood in terms of energy loss due to electronic stopping and nuclear stopping powers. Refractive index changes with an order of 10- 4 to 10- 2 were estimated by a Lorentz-Lorenz relationship from the compaction. Technological implications of these results are also to be discussed.",
keywords = "Atomic force microscopy, Ion microbeam, Photoluminescence, Refractive index, Silica glass",
author = "Hiroyuki Nishikawa and M. Murai and T. Nakamura and Y. Ohki and M. Oikawa and T. Sato and T. Sakai and Y. Ishii and M. Fukuda",
year = "2007",
month = "8",
day = "5",
doi = "10.1016/j.surfcoat.2006.12.031",
language = "English",
volume = "201",
pages = "8185--8189",
journal = "Surface and Coatings Technology",
issn = "0257-8972",
publisher = "Elsevier",
number = "19-20 SPEC. ISS.",

}

TY - JOUR

T1 - Modification of structural and optical properties of silica glass induced by ion microbeam

AU - Nishikawa, Hiroyuki

AU - Murai, M.

AU - Nakamura, T.

AU - Ohki, Y.

AU - Oikawa, M.

AU - Sato, T.

AU - Sakai, T.

AU - Ishii, Y.

AU - Fukuda, M.

PY - 2007/8/5

Y1 - 2007/8/5

N2 - Structural and optical properties of silica glass induced by ion microbeam irradiation were studied using micro- photoluminescence (μ-PL) spectroscopy and atomic force microscopy (AFM). Ion microbeam irradiation was performed using microbeam lines of 3-MV single-ended or tandem accelerators with various ion species including H+, He+, B3+, C4+, N4+, O4+, and Si5+ at energies of 1.7 to 18 MeV. The beam was focused to about 1 μm and was scanned over the surface of high-purity silica glass with fluences of 1013 to 1018 ions/cm2. The μ-PL spectrum in microbeam-irradiated silica shows two peaks at 540 and 650 nm. The mapping of the two PL bands reveals the distribution of defects induced along the track of ions. The compaction was observed in the form of groove at the surface of silica glass by AFM. The depth of the surface groove increases with increasing ion fluence and saturates at about several hundreds to 900 nm, depending on irradiated ion species. The mechanisms of structural and optical modifications of silica glass are can be understood in terms of energy loss due to electronic stopping and nuclear stopping powers. Refractive index changes with an order of 10- 4 to 10- 2 were estimated by a Lorentz-Lorenz relationship from the compaction. Technological implications of these results are also to be discussed.

AB - Structural and optical properties of silica glass induced by ion microbeam irradiation were studied using micro- photoluminescence (μ-PL) spectroscopy and atomic force microscopy (AFM). Ion microbeam irradiation was performed using microbeam lines of 3-MV single-ended or tandem accelerators with various ion species including H+, He+, B3+, C4+, N4+, O4+, and Si5+ at energies of 1.7 to 18 MeV. The beam was focused to about 1 μm and was scanned over the surface of high-purity silica glass with fluences of 1013 to 1018 ions/cm2. The μ-PL spectrum in microbeam-irradiated silica shows two peaks at 540 and 650 nm. The mapping of the two PL bands reveals the distribution of defects induced along the track of ions. The compaction was observed in the form of groove at the surface of silica glass by AFM. The depth of the surface groove increases with increasing ion fluence and saturates at about several hundreds to 900 nm, depending on irradiated ion species. The mechanisms of structural and optical modifications of silica glass are can be understood in terms of energy loss due to electronic stopping and nuclear stopping powers. Refractive index changes with an order of 10- 4 to 10- 2 were estimated by a Lorentz-Lorenz relationship from the compaction. Technological implications of these results are also to be discussed.

KW - Atomic force microscopy

KW - Ion microbeam

KW - Photoluminescence

KW - Refractive index

KW - Silica glass

UR - http://www.scopus.com/inward/record.url?scp=34447503597&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34447503597&partnerID=8YFLogxK

U2 - 10.1016/j.surfcoat.2006.12.031

DO - 10.1016/j.surfcoat.2006.12.031

M3 - Article

AN - SCOPUS:34447503597

VL - 201

SP - 8185

EP - 8189

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

SN - 0257-8972

IS - 19-20 SPEC. ISS.

ER -