Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari, S. Takehara, S. Mononobe, G. H. Lee, M. Yoshimoto, H. Koinuna, M. Ohtsu

Research output: Contribution to conferencePaper

Abstract

A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

Original languageEnglish
Number of pages1
Publication statusPublished - 1997 Jan 1
Externally publishedYes
EventProceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn
Duration: 1997 Jul 141997 Jul 18

Other

OtherProceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim
CityChiba, Jpn
Period97/7/1497/7/18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Maheswari, R. U., Takehara, S., Mononobe, S., Lee, G. H., Yoshimoto, M., Koinuna, H., & Ohtsu, M. (1997). Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, .