Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari; S. Takehara; S. Mononobe; G. H. Lee; M. Yoshimoto; H. Koinuna; M. Ohtsu

Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari, S. Takehara, S. Mononobe, G. H. Lee, M. Yoshimoto, H. Koinuna, M. Ohtsu

Research output: Contribution to conference › Paper › peer-review

Abstract

A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

Original language	English
Pages	306
Number of pages	1
Publication status	Published - 1997
Externally published	Yes
Event	Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn Duration: 1997 Jul 14 → 1997 Jul 18

Other

Other	Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim
City	Chiba, Jpn
Period	97/7/14 → 97/7/18

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

Cite this

Maheswari, R. U., Takehara, S., Mononobe, S., Lee, G. H., Yoshimoto, M., Koinuna, H., & Ohtsu, M. (1997). Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. 306. Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, .

Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. / Maheswari, R. Uma; Takehara, S.; Mononobe, S.; Lee, G. H.; Yoshimoto, M.; Koinuna, H.; Ohtsu, M.

1997. 306 Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, .

Research output: Contribution to conference › Paper › peer-review

Maheswari, RU, Takehara, S, Mononobe, S, Lee, GH, Yoshimoto, M, Koinuna, H & Ohtsu, M 1997, 'Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback', Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, 97/7/14 - 97/7/18 pp. 306.

Maheswari, R. Uma ; Takehara, S. ; Mononobe, S. ; Lee, G. H. ; Yoshimoto, M. ; Koinuna, H. ; Ohtsu, M. / Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, .1 p.

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abstract = "A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.",

author = "Maheswari, {R. Uma} and S. Takehara and S. Mononobe and Lee, {G. H.} and M. Yoshimoto and H. Koinuna and M. Ohtsu",

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AU - Maheswari, R. Uma

AU - Takehara, S.

AU - Mononobe, S.

AU - Lee, G. H.

AU - Yoshimoto, M.

AU - Koinuna, H.

AU - Ohtsu, M.

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AB - A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

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Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

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