Near-ideal Schottky contact on quaternary AlInGaN epilayer lattice-matched with GaN

Y. Liu; T. Egawa; H. Jiang; B. Zhang; H. Ishikawa; M. Hao

doi:10.1063/1.1834729

Near-ideal Schottky contact on quaternary AlInGaN epilayer lattice-matched with GaN

Y. Liu, T. Egawa, H. Jiang, B. Zhang, H. Ishikawa, M. Hao

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

PdTiAu and NiAu Schottky barrier diodes (SBDs) were demonstrated on quaternary AlInGaN. Current-voltage properties indicated that near-ideal and high-performance SBDs had been realized with ideality factor of 1.05, 1.07 and barrier height of 1.32, 0.98 eV for Pd and Ni SBDs, respectively. Capacitance-voltage measurement revealed that the high-density two-dimensional electron gas (2DEG) located at the AlInGaNGaN interface. Ruling out the possible contribution from piezoelectric polarization and conduction band offset, we believe that the formation of 2DEG is due to the existence of large spontaneous polarization in AlInGaN layer, which experimentally verifies the feasible application of quaternary AlInGaN in the high-electron-mobility transistor.

Original language	English
Pages (from-to)	6030-6032
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	24
DOIs	https://doi.org/10.1063/1.1834729
Publication status	Published - 2004 Dec 13
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{c1a2ca06099c44439e94d5f50f7d7e33,

title = "Near-ideal Schottky contact on quaternary AlInGaN epilayer lattice-matched with GaN",

abstract = "PdTiAu and NiAu Schottky barrier diodes (SBDs) were demonstrated on quaternary AlInGaN. Current-voltage properties indicated that near-ideal and high-performance SBDs had been realized with ideality factor of 1.05, 1.07 and barrier height of 1.32, 0.98 eV for Pd and Ni SBDs, respectively. Capacitance-voltage measurement revealed that the high-density two-dimensional electron gas (2DEG) located at the AlInGaNGaN interface. Ruling out the possible contribution from piezoelectric polarization and conduction band offset, we believe that the formation of 2DEG is due to the existence of large spontaneous polarization in AlInGaN layer, which experimentally verifies the feasible application of quaternary AlInGaN in the high-electron-mobility transistor.",

author = "Y. Liu and T. Egawa and H. Jiang and B. Zhang and H. Ishikawa and M. Hao",

note = "Funding Information: Y.L. is grateful to JSPS for the award of a postdoctoral fellowship (ID. #P02329). He also would like to extend his thanks to Dr. S. Arulkumaran and Professor C. Shao for their kind help and helpful discussion. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.",

year = "2004",

month = dec,

day = "13",

doi = "10.1063/1.1834729",

language = "English",

volume = "85",

pages = "6030--6032",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "24",

}

TY - JOUR

T1 - Near-ideal Schottky contact on quaternary AlInGaN epilayer lattice-matched with GaN

AU - Liu, Y.

AU - Egawa, T.

AU - Jiang, H.

AU - Zhang, B.

AU - Ishikawa, H.

AU - Hao, M.

N1 - Funding Information: Y.L. is grateful to JSPS for the award of a postdoctoral fellowship (ID. #P02329). He also would like to extend his thanks to Dr. S. Arulkumaran and Professor C. Shao for their kind help and helpful discussion. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.

PY - 2004/12/13

Y1 - 2004/12/13

N2 - PdTiAu and NiAu Schottky barrier diodes (SBDs) were demonstrated on quaternary AlInGaN. Current-voltage properties indicated that near-ideal and high-performance SBDs had been realized with ideality factor of 1.05, 1.07 and barrier height of 1.32, 0.98 eV for Pd and Ni SBDs, respectively. Capacitance-voltage measurement revealed that the high-density two-dimensional electron gas (2DEG) located at the AlInGaNGaN interface. Ruling out the possible contribution from piezoelectric polarization and conduction band offset, we believe that the formation of 2DEG is due to the existence of large spontaneous polarization in AlInGaN layer, which experimentally verifies the feasible application of quaternary AlInGaN in the high-electron-mobility transistor.

AB - PdTiAu and NiAu Schottky barrier diodes (SBDs) were demonstrated on quaternary AlInGaN. Current-voltage properties indicated that near-ideal and high-performance SBDs had been realized with ideality factor of 1.05, 1.07 and barrier height of 1.32, 0.98 eV for Pd and Ni SBDs, respectively. Capacitance-voltage measurement revealed that the high-density two-dimensional electron gas (2DEG) located at the AlInGaNGaN interface. Ruling out the possible contribution from piezoelectric polarization and conduction band offset, we believe that the formation of 2DEG is due to the existence of large spontaneous polarization in AlInGaN layer, which experimentally verifies the feasible application of quaternary AlInGaN in the high-electron-mobility transistor.

UR - http://www.scopus.com/inward/record.url?scp=20444462011&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=20444462011&partnerID=8YFLogxK

U2 - 10.1063/1.1834729

DO - 10.1063/1.1834729

M3 - Article

AN - SCOPUS:20444462011

SN - 0003-6951

VL - 85

SP - 6030

EP - 6032

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

ER -

Near-ideal Schottky contact on quaternary AlInGaN epilayer lattice-matched with GaN

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