Nondestructive elemental depth-profiling analysis by muonic X-ray measurement

Kazuhiko Ninomiya, Michael K. Kubo, Takashi Nagatomo, Wataru Higemoto, Takashi U. Ito, Naritoshi Kawamura, Patrick Strasser, Koichiro Shimomura, Yasuhiro Miyake, Takao Suzuki, Yoshio Kobayashi, Shinichi Sakamoto, Atsushi Shinohara, Tsutomu Saito

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, our project team, dreamX (damageless and regioselective elemental analysis with muonic X-rays), developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale. We believe that this method will be a promising tool for the elemental analysis of valuable samples, such as archeological artifacts.

Original languageEnglish
Pages (from-to)4597-4600
Number of pages4
JournalAnalytical Chemistry
Volume87
Issue number9
DOIs
Publication statusPublished - 2015 May 5

Fingerprint

Depth profiling
X rays
Chemical analysis
Gold
Momentum

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Ninomiya, K., Kubo, M. K., Nagatomo, T., Higemoto, W., Ito, T. U., Kawamura, N., ... Saito, T. (2015). Nondestructive elemental depth-profiling analysis by muonic X-ray measurement. Analytical Chemistry, 87(9), 4597-4600. https://doi.org/10.1021/acs.analchem.5b01169

Nondestructive elemental depth-profiling analysis by muonic X-ray measurement. / Ninomiya, Kazuhiko; Kubo, Michael K.; Nagatomo, Takashi; Higemoto, Wataru; Ito, Takashi U.; Kawamura, Naritoshi; Strasser, Patrick; Shimomura, Koichiro; Miyake, Yasuhiro; Suzuki, Takao; Kobayashi, Yoshio; Sakamoto, Shinichi; Shinohara, Atsushi; Saito, Tsutomu.

In: Analytical Chemistry, Vol. 87, No. 9, 05.05.2015, p. 4597-4600.

Research output: Contribution to journalArticle

Ninomiya, K, Kubo, MK, Nagatomo, T, Higemoto, W, Ito, TU, Kawamura, N, Strasser, P, Shimomura, K, Miyake, Y, Suzuki, T, Kobayashi, Y, Sakamoto, S, Shinohara, A & Saito, T 2015, 'Nondestructive elemental depth-profiling analysis by muonic X-ray measurement', Analytical Chemistry, vol. 87, no. 9, pp. 4597-4600. https://doi.org/10.1021/acs.analchem.5b01169
Ninomiya K, Kubo MK, Nagatomo T, Higemoto W, Ito TU, Kawamura N et al. Nondestructive elemental depth-profiling analysis by muonic X-ray measurement. Analytical Chemistry. 2015 May 5;87(9):4597-4600. https://doi.org/10.1021/acs.analchem.5b01169
Ninomiya, Kazuhiko ; Kubo, Michael K. ; Nagatomo, Takashi ; Higemoto, Wataru ; Ito, Takashi U. ; Kawamura, Naritoshi ; Strasser, Patrick ; Shimomura, Koichiro ; Miyake, Yasuhiro ; Suzuki, Takao ; Kobayashi, Yoshio ; Sakamoto, Shinichi ; Shinohara, Atsushi ; Saito, Tsutomu. / Nondestructive elemental depth-profiling analysis by muonic X-ray measurement. In: Analytical Chemistry. 2015 ; Vol. 87, No. 9. pp. 4597-4600.
@article{136e9bf3889f40f0abd3e83278788a24,
title = "Nondestructive elemental depth-profiling analysis by muonic X-ray measurement",
abstract = "Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, our project team, dreamX (damageless and regioselective elemental analysis with muonic X-rays), developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale. We believe that this method will be a promising tool for the elemental analysis of valuable samples, such as archeological artifacts.",
author = "Kazuhiko Ninomiya and Kubo, {Michael K.} and Takashi Nagatomo and Wataru Higemoto and Ito, {Takashi U.} and Naritoshi Kawamura and Patrick Strasser and Koichiro Shimomura and Yasuhiro Miyake and Takao Suzuki and Yoshio Kobayashi and Shinichi Sakamoto and Atsushi Shinohara and Tsutomu Saito",
year = "2015",
month = "5",
day = "5",
doi = "10.1021/acs.analchem.5b01169",
language = "English",
volume = "87",
pages = "4597--4600",
journal = "Analytical Chemistry",
issn = "0003-2700",
publisher = "American Chemical Society",
number = "9",

}

TY - JOUR

T1 - Nondestructive elemental depth-profiling analysis by muonic X-ray measurement

AU - Ninomiya, Kazuhiko

AU - Kubo, Michael K.

AU - Nagatomo, Takashi

AU - Higemoto, Wataru

AU - Ito, Takashi U.

AU - Kawamura, Naritoshi

AU - Strasser, Patrick

AU - Shimomura, Koichiro

AU - Miyake, Yasuhiro

AU - Suzuki, Takao

AU - Kobayashi, Yoshio

AU - Sakamoto, Shinichi

AU - Shinohara, Atsushi

AU - Saito, Tsutomu

PY - 2015/5/5

Y1 - 2015/5/5

N2 - Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, our project team, dreamX (damageless and regioselective elemental analysis with muonic X-rays), developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale. We believe that this method will be a promising tool for the elemental analysis of valuable samples, such as archeological artifacts.

AB - Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, our project team, dreamX (damageless and regioselective elemental analysis with muonic X-rays), developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale. We believe that this method will be a promising tool for the elemental analysis of valuable samples, such as archeological artifacts.

UR - http://www.scopus.com/inward/record.url?scp=84928920299&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84928920299&partnerID=8YFLogxK

U2 - 10.1021/acs.analchem.5b01169

DO - 10.1021/acs.analchem.5b01169

M3 - Article

AN - SCOPUS:84928920299

VL - 87

SP - 4597

EP - 4600

JO - Analytical Chemistry

JF - Analytical Chemistry

SN - 0003-2700

IS - 9

ER -