Numerical analysis of buffer-trap effects on gate lag in AlGaN/GaN high electron mobility transistors

A. Nakajima, K. Fujii, K. Horio

Research output: Contribution to journal › Article › peer-review

Cite this

@article{fda7c1bdf7284d75af39034bc35a4090,

title = "Numerical analysis of buffer-trap effects on gate lag in AlGaN/GaN high electron mobility transistors",

author = "A. Nakajima and K. Fujii and K. Horio",

year = "2011",

month = oct,

day = "20",

language = "English",

volume = "50",

pages = "104303--1--104303--6",

journal = "Jpn. J. Appl. Phys.",

}