Numerical analysis of current transients and power slump in GaAs and GaN FETs

K. Horio, Y. Kazami, D. Kasai, K. Yonemoto

Research output: Contribution to journalArticle

Original languageEnglish
Journal2004 Asia-Pacific Microwave Conference Proceedings
Publication statusPublished - 2004 Dec 1

Cite this

Numerical analysis of current transients and power slump in GaAs and GaN FETs. / Horio, K.; Kazami, Y.; Kasai, D.; Yonemoto, K.

In: 2004 Asia-Pacific Microwave Conference Proceedings, 01.12.2004.

Research output: Contribution to journalArticle

@article{5d0d6a4b45904838b1fbc0f9359b52a4,
title = "Numerical analysis of current transients and power slump in GaAs and GaN FETs",
author = "K. Horio and Y. Kazami and D. Kasai and K. Yonemoto",
year = "2004",
month = "12",
day = "1",
language = "English",
journal = "2004 Asia-Pacific Microwave Conference Proceedings",

}

TY - JOUR

T1 - Numerical analysis of current transients and power slump in GaAs and GaN FETs

AU - Horio, K.

AU - Kazami, Y.

AU - Kasai, D.

AU - Yonemoto, K.

PY - 2004/12/1

Y1 - 2004/12/1

M3 - Article

JO - 2004 Asia-Pacific Microwave Conference Proceedings

JF - 2004 Asia-Pacific Microwave Conference Proceedings

ER -