| Original language | English |
|---|---|
| Journal | 2004 Asia-Pacific Microwave Conference Proceedings |
| Publication status | Published - 2004 Dec 1 |
Cite this
Horio, K., Kazami, Y., Kasai, D., & Yonemoto, K. (2004). Numerical analysis of current transients and power slump in GaAs and GaN FETs. 2004 Asia-Pacific Microwave Conference Proceedings.