Numerical Modelling of Gate-Lag Phenomena in GaAs MESFETs and HEMTs

K.Horio K.Horio, Kazushige Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)247
JournalAbstracts of URSI GA'99, Toronto, Canada
Publication statusPublished - 1999 Aug 1

Cite this

Numerical Modelling of Gate-Lag Phenomena in GaAs MESFETs and HEMTs. / K.Horio, K.Horio; Horio, Kazushige.

In: Abstracts of URSI GA'99, Toronto, Canada, 01.08.1999, p. 247.

Research output: Contribution to journalArticle

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