Numerical simulation of drain-current transients and current compression in GaN MESFETs

H. Takayanagi, K. Itagaki, K. Horio

Research output: Contribution to conferencePaperpeer-review

Fingerprint

Dive into the research topics of 'Numerical simulation of drain-current transients and current compression in GaN MESFETs'. Together they form a unique fingerprint.

Engineering & Materials Science