Observation of the creation and annihilation of local current paths in HfO2 thin films on pt by ultrahigh-vacuum conductive atomic force microscopy

Evidence of oxygen spill over during the forming process

Naotaka Sasaki, Koji Kita, Akira Toriumi, Kentaro Kyuno

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

By direct observation using ultrahigh-vacuum conductive atomic force microscopy, we find the reversible creation and annihilation of individual local current paths in HfO2 thin films on Pt. Experimental evidence of oxygen ion diffusion due to an electric field is obtained.

Original languageEnglish
Article number060202
JournalJapanese Journal of Applied Physics
Volume48
Issue number6
DOIs
Publication statusPublished - 2009 Jun

Fingerprint

Hazardous materials spills
Ultrahigh vacuum
oxygen ions
ultrahigh vacuum
Atomic force microscopy
Electric fields
atomic force microscopy
Thin films
Oxygen
electric fields
Ions
oxygen
thin films

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

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title = "Observation of the creation and annihilation of local current paths in HfO2 thin films on pt by ultrahigh-vacuum conductive atomic force microscopy: Evidence of oxygen spill over during the forming process",
abstract = "By direct observation using ultrahigh-vacuum conductive atomic force microscopy, we find the reversible creation and annihilation of individual local current paths in HfO2 thin films on Pt. Experimental evidence of oxygen ion diffusion due to an electric field is obtained.",
author = "Naotaka Sasaki and Koji Kita and Akira Toriumi and Kentaro Kyuno",
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T2 - Evidence of oxygen spill over during the forming process

AU - Sasaki, Naotaka

AU - Kita, Koji

AU - Toriumi, Akira

AU - Kyuno, Kentaro

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