Original language | English |
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Journal | Japanese Journal of Applied Physics |
Volume | 48 |
Publication status | Published - 2009 Jun 1 |
Observation of the creation and annihilation of local current paths in HfO2 thin films on Pt by ultrahigh-vacuum conductive atomic force microscopy : Evidence of oxygen spill over during the forming process
N.Sasaki N.Sasaki, K.Kita K.Kita, A.Toriumi A.Toriumi, K.Kyuno K.Kyuno, Kentaro Kyuno
Research output: Contribution to journal › Article › peer-review
9
Citations
(Scopus)