OIM and X-ray texture analysis of melt-textured YBCO super-conductors

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

The results of two independent texture measurements on melt-textured Y-Ba-Cu-O (YBCO) high-T c superconductors are compared with each other. The texture data are acquired by means of an X-ray based pole figure texture analysis and of a local texture analysis provided by an automated electron-backscatter diffraction (EBSD) or often called orientation imaging microscopy (OIM) analysis. As samples, we employ two different melt-textured YBCO samples; one fully processed (orthorhombic) and one without oxygen treatment (tetragonal). Pole figures in [103] direction are used to enable a direct comparison. We find a clear coincidence between the results obtained by the two measurement techniques on the melt-textured YBCO samples, however, the EBSD results are much more detailed, yielding the local grain orientation distribution and quantitative results of the grain or subgrain misorientation angles. Therefore, the EBSD measurements give informations which are not accessible by the X-ray texture analysis.

Original languageEnglish
Title of host publicationPhysica Status Solidi C: Conferences
Pages1708-1713
Number of pages6
Volume2
Edition5
DOIs
Publication statusPublished - 2005

Fingerprint

textures
conductors
microscopy
x rays
poles
diffraction
electrons
misalignment
oxygen

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

OIM and X-ray texture analysis of melt-textured YBCO super-conductors. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Mücklich, F.; Murakami, Masato.

Physica Status Solidi C: Conferences. Vol. 2 5. ed. 2005. p. 1708-1713.

Research output: Chapter in Book/Report/Conference proceedingChapter

@inbook{c3c9221650734d2c9bb618632b7c382a,
title = "OIM and X-ray texture analysis of melt-textured YBCO super-conductors",
abstract = "The results of two independent texture measurements on melt-textured Y-Ba-Cu-O (YBCO) high-T c superconductors are compared with each other. The texture data are acquired by means of an X-ray based pole figure texture analysis and of a local texture analysis provided by an automated electron-backscatter diffraction (EBSD) or often called orientation imaging microscopy (OIM) analysis. As samples, we employ two different melt-textured YBCO samples; one fully processed (orthorhombic) and one without oxygen treatment (tetragonal). Pole figures in [103] direction are used to enable a direct comparison. We find a clear coincidence between the results obtained by the two measurement techniques on the melt-textured YBCO samples, however, the EBSD results are much more detailed, yielding the local grain orientation distribution and quantitative results of the grain or subgrain misorientation angles. Therefore, the EBSD measurements give informations which are not accessible by the X-ray texture analysis.",
author = "Koblischka-Veneva, {Anjela Dimitrova} and Koblischka, {Michael Rudolf} and F. M{\"u}cklich and Masato Murakami",
year = "2005",
doi = "10.1002/pssc.200460816",
language = "English",
volume = "2",
pages = "1708--1713",
booktitle = "Physica Status Solidi C: Conferences",
edition = "5",

}

TY - CHAP

T1 - OIM and X-ray texture analysis of melt-textured YBCO super-conductors

AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Mücklich, F.

AU - Murakami, Masato

PY - 2005

Y1 - 2005

N2 - The results of two independent texture measurements on melt-textured Y-Ba-Cu-O (YBCO) high-T c superconductors are compared with each other. The texture data are acquired by means of an X-ray based pole figure texture analysis and of a local texture analysis provided by an automated electron-backscatter diffraction (EBSD) or often called orientation imaging microscopy (OIM) analysis. As samples, we employ two different melt-textured YBCO samples; one fully processed (orthorhombic) and one without oxygen treatment (tetragonal). Pole figures in [103] direction are used to enable a direct comparison. We find a clear coincidence between the results obtained by the two measurement techniques on the melt-textured YBCO samples, however, the EBSD results are much more detailed, yielding the local grain orientation distribution and quantitative results of the grain or subgrain misorientation angles. Therefore, the EBSD measurements give informations which are not accessible by the X-ray texture analysis.

AB - The results of two independent texture measurements on melt-textured Y-Ba-Cu-O (YBCO) high-T c superconductors are compared with each other. The texture data are acquired by means of an X-ray based pole figure texture analysis and of a local texture analysis provided by an automated electron-backscatter diffraction (EBSD) or often called orientation imaging microscopy (OIM) analysis. As samples, we employ two different melt-textured YBCO samples; one fully processed (orthorhombic) and one without oxygen treatment (tetragonal). Pole figures in [103] direction are used to enable a direct comparison. We find a clear coincidence between the results obtained by the two measurement techniques on the melt-textured YBCO samples, however, the EBSD results are much more detailed, yielding the local grain orientation distribution and quantitative results of the grain or subgrain misorientation angles. Therefore, the EBSD measurements give informations which are not accessible by the X-ray texture analysis.

UR - http://www.scopus.com/inward/record.url?scp=27444445878&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=27444445878&partnerID=8YFLogxK

U2 - 10.1002/pssc.200460816

DO - 10.1002/pssc.200460816

M3 - Chapter

AN - SCOPUS:27444445878

VL - 2

SP - 1708

EP - 1713

BT - Physica Status Solidi C: Conferences

ER -