Open/Short Testing of Thin Film Multilayer Substrates,

Y.Iseki Y.Iseki, S.kimijima S.kimijima, T.Sudo T.Sudo, Toshio Sudo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)265-267
JournalJapan IEMT
Publication statusPublished - 1992 Oct 1

Cite this

Y.Iseki, Y. I., S.kimijima, S. K., T.Sudo, T. S., & Sudo, T. (1992). Open/Short Testing of Thin Film Multilayer Substrates, Japan IEMT, 265-267.