Open/Short Testing of Thin Film Multilayer Substrates,

Y.Iseki Y.Iseki, S.kimijima S.kimijima, T.Sudo T.Sudo, Toshio Sudo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)265-267
JournalJapan IEMT
Publication statusPublished - 1992 Oct 1

Cite this

Y.Iseki, Y. I., S.kimijima, S. K., T.Sudo, T. S., & Sudo, T. (1992). Open/Short Testing of Thin Film Multilayer Substrates, Japan IEMT, 265-267.

Open/Short Testing of Thin Film Multilayer Substrates, / Y.Iseki, Y.Iseki; S.kimijima, S.kimijima; T.Sudo, T.Sudo; Sudo, Toshio.

In: Japan IEMT, 01.10.1992, p. 265-267.

Research output: Contribution to journalArticle

Y.Iseki, YI, S.kimijima, SK, T.Sudo, TS & Sudo, T 1992, 'Open/Short Testing of Thin Film Multilayer Substrates,', Japan IEMT, pp. 265-267.
Y.Iseki YI, S.kimijima SK, T.Sudo TS, Sudo T. Open/Short Testing of Thin Film Multilayer Substrates, Japan IEMT. 1992 Oct 1;265-267.
Y.Iseki, Y.Iseki ; S.kimijima, S.kimijima ; T.Sudo, T.Sudo ; Sudo, Toshio. / Open/Short Testing of Thin Film Multilayer Substrates,. In: Japan IEMT. 1992 ; pp. 265-267.
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