Optical characterization of GaN/sapphire films by spectroscopic ellipsometery and the optical transmission method

G. Wang, G. Yu, H. Ishikawa, T. Egawa, J. Watanabe, T. Jimbo, M. Umeno

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)28p-D-1
JournalDefault journal
Publication statusPublished - 1997 Mar 1

Cite this

Optical characterization of GaN/sapphire films by spectroscopic ellipsometery and the optical transmission method. / Wang, G.; Yu, G.; Ishikawa, H.; Egawa, T.; Watanabe, J.; Jimbo, T.; Umeno, M.

In: Default journal, 01.03.1997, p. 28p-D-1.

Research output: Contribution to journalArticle

Wang, G. ; Yu, G. ; Ishikawa, H. ; Egawa, T. ; Watanabe, J. ; Jimbo, T. ; Umeno, M. / Optical characterization of GaN/sapphire films by spectroscopic ellipsometery and the optical transmission method. In: Default journal. 1997 ; pp. 28p-D-1.
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AU - Watanabe, J.

AU - Jimbo, T.

AU - Umeno, M.

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