Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry

G. Yu, H. Ishikawa, M. Umeno, T. Egawa, J. Watanabe, T. Jimbo, T. Soga

Research output: Contribution to journalArticle

49 Citations (Scopus)
Original languageEnglish
Pages (from-to)2202-2204
JournalAppl. Phys. Lett.
Volume72
Publication statusPublished - 1998 May 1

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Yu, G., Ishikawa, H., Umeno, M., Egawa, T., Watanabe, J., Jimbo, T., & Soga, T. (1998). Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry. Appl. Phys. Lett., 72, 2202-2204.