Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method

G. Yu; G. Wang; H. Ishikawa; M. Umeno; T. Soga; T. Egawa; J. Watanabe; T. Jimbo

Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method

G. Yu, G. Wang, H. Ishikawa, M. Umeno, T. Soga, T. Egawa, J. Watanabe, T. Jimbo

Functional Control Systems

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	3209-3211
Journal	Appl. Phys. Lett.
Volume	70
Publication status	Published - 1997 Jun 1

Cite this

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title = "Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method",

author = "G. Yu and G. Wang and H. Ishikawa and M. Umeno and T. Soga and T. Egawa and J. Watanabe and T. Jimbo",

year = "1997",

month = jun,

day = "1",

language = "English",

volume = "70",

pages = "3209--3211",

journal = "Appl. Phys. Lett.",

}

TY - JOUR

T1 - Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method

AU - Yu, G.

AU - Wang, G.

AU - Ishikawa, H.

AU - Umeno, M.

AU - Soga, T.

AU - Egawa, T.

AU - Watanabe, J.

AU - Jimbo, T.

PY - 1997/6/1

Y1 - 1997/6/1

M3 - Article

VL - 70

SP - 3209

EP - 3211

JO - Appl. Phys. Lett.

JF - Appl. Phys. Lett.

ER -