Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method

G. Yu, G. Wang, H. Ishikawa, M. Umeno, T. Soga, T. Egawa, J. Watanabe, T. Jimbo

Research output: Contribution to journalArticle

225 Citations (Scopus)
Original languageEnglish
Pages (from-to)3209-3211
JournalAppl. Phys. Lett.
Volume70
Publication statusPublished - 1997 Jun 1

Cite this

Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method. / Yu, G.; Wang, G.; Ishikawa, H.; Umeno, M.; Soga, T.; Egawa, T.; Watanabe, J.; Jimbo, T.

In: Appl. Phys. Lett., Vol. 70, 01.06.1997, p. 3209-3211.

Research output: Contribution to journalArticle

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AU - Umeno, M.

AU - Soga, T.

AU - Egawa, T.

AU - Watanabe, J.

AU - Jimbo, T.

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