Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2012 Dec 1

Cite this

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title = "Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials",
author = "Nellist, {P. D.} and Kirkl, {P. D.Nellist;P.Wang;A.I.} and Shimojo, {;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take}",
year = "2012",
month = "12",
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language = "English",
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TY - JOUR

T1 - Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

AU - Nellist, P. D.

AU - Kirkl, P. D.Nellist;P.Wang;A.I.

AU - Shimojo, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take

PY - 2012/12/1

Y1 - 2012/12/1

M3 - Article

JO - Default journal

JF - Default journal

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