Orientation imaging microscopy applied to BaTiO3 ceramics

A. Koblischka-Veneva; F. Mücklich

doi:10.1016/S1463-0184(02)00034-5

Orientation imaging microscopy applied to BaTiO₃ ceramics

A. Koblischka-Veneva, F. Mücklich

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

By means of orientation imaging microscopy, we have investigated grain orientation distributions of various BaTiO₃ ceramic samples prepared using different preparation routes. We present details of the required surface preparation steps in order to enable an automated orientation mapping. The samples are characterized by image quality (IQ), grain size (GS) and grain orientation (IPF) maps. Finally, the grain orientation distribution functions are obtained from the measured data. It is shown that the samples do not exhibit any preferred grain orientations.

Original language	English
Pages (from-to)	235-242
Number of pages	8
Journal	Crystal Engineering
Volume	5
Issue number	3-4 SPEC.
DOIs	https://doi.org/10.1016/S1463-0184(02)00034-5
Publication status	Published - 2002 Jan 1
Externally published	Yes

Keywords

BaTiO ceramics
Grain orientation
OIM analysis

ASJC Scopus subject areas

Chemistry(all)
Materials Chemistry

Access to Document

10.1016/S1463-0184(02)00034-5

Fingerprint Dive into the research topics of 'Orientation imaging microscopy applied to BaTiO<sub>3</sub> ceramics'. Together they form a unique fingerprint.

Cite this

@article{873e2133e2304569a6a6e449e6543b40,

title = "Orientation imaging microscopy applied to BaTiO3 ceramics",

abstract = "By means of orientation imaging microscopy, we have investigated grain orientation distributions of various BaTiO3 ceramic samples prepared using different preparation routes. We present details of the required surface preparation steps in order to enable an automated orientation mapping. The samples are characterized by image quality (IQ), grain size (GS) and grain orientation (IPF) maps. Finally, the grain orientation distribution functions are obtained from the measured data. It is shown that the samples do not exhibit any preferred grain orientations.",

keywords = "BaTiO ceramics, Grain orientation, OIM analysis",

author = "A. Koblischka-Veneva and F. M{\"u}cklich",

year = "2002",

month = jan,

day = "1",

doi = "10.1016/S1463-0184(02)00034-5",

language = "English",

volume = "5",

pages = "235--242",

journal = "Crystal Engineering",

issn = "1463-0184",

publisher = "Pergamon Press Ltd.",

number = "3-4 SPEC.",

}

TY - JOUR

T1 - Orientation imaging microscopy applied to BaTiO3 ceramics

AU - Koblischka-Veneva, A.

AU - Mücklich, F.

PY - 2002/1/1

Y1 - 2002/1/1

N2 - By means of orientation imaging microscopy, we have investigated grain orientation distributions of various BaTiO3 ceramic samples prepared using different preparation routes. We present details of the required surface preparation steps in order to enable an automated orientation mapping. The samples are characterized by image quality (IQ), grain size (GS) and grain orientation (IPF) maps. Finally, the grain orientation distribution functions are obtained from the measured data. It is shown that the samples do not exhibit any preferred grain orientations.

AB - By means of orientation imaging microscopy, we have investigated grain orientation distributions of various BaTiO3 ceramic samples prepared using different preparation routes. We present details of the required surface preparation steps in order to enable an automated orientation mapping. The samples are characterized by image quality (IQ), grain size (GS) and grain orientation (IPF) maps. Finally, the grain orientation distribution functions are obtained from the measured data. It is shown that the samples do not exhibit any preferred grain orientations.

KW - BaTiO ceramics

KW - Grain orientation

KW - OIM analysis

UR - http://www.scopus.com/inward/record.url?scp=0037288042&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037288042&partnerID=8YFLogxK

U2 - 10.1016/S1463-0184(02)00034-5

DO - 10.1016/S1463-0184(02)00034-5

M3 - Article

AN - SCOPUS:0037288042

VL - 5

SP - 235

EP - 242

JO - Crystal Engineering

JF - Crystal Engineering

SN - 1463-0184

IS - 3-4 SPEC.

ER -