Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions

M.F. Frechette, C.Hudon C.Hudon, M. Germain, R.Y.Larocque R.Y.Larocque, Satoshi Matsumoto, Tokihiro Umemura

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)639-644
JournalIEEE Conf. on Electr. Insul. and Diel. Phen.
Publication statusPublished - 2000 Oct 15

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Frechette, M. F., C.Hudon, C. H., Germain, M., R.Y.Larocque, R. Y. L., Matsumoto, S., & Umemura, T. (2000). Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions. IEEE Conf. on Electr. Insul. and Diel. Phen., 639-644.