Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions

M.F. Frechette, C.Hudon C.Hudon, M. Germain, R.Y.Larocque R.Y.Larocque, Satoshi Matsumoto, Tokihiro Umemura

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)639-644
JournalIEEE Conf. on Electr. Insul. and Diel. Phen.
Publication statusPublished - 2000 Oct 15

Cite this

Frechette, M. F., C.Hudon, C. H., Germain, M., R.Y.Larocque, R. Y. L., Matsumoto, S., & Umemura, T. (2000). Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions. IEEE Conf. on Electr. Insul. and Diel. Phen., 639-644.

Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions. / Frechette, M.F.; C.Hudon, C.Hudon; Germain, M.; R.Y.Larocque, R.Y.Larocque; Matsumoto, Satoshi; Umemura, Tokihiro.

In: IEEE Conf. on Electr. Insul. and Diel. Phen., 15.10.2000, p. 639-644.

Research output: Contribution to journalArticle

Frechette, MF, C.Hudon, CH, Germain, M, R.Y.Larocque, RYL, Matsumoto, S & Umemura, T 2000, 'Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions', IEEE Conf. on Electr. Insul. and Diel. Phen., pp. 639-644.
Frechette, M.F. ; C.Hudon, C.Hudon ; Germain, M. ; R.Y.Larocque, R.Y.Larocque ; Matsumoto, Satoshi ; Umemura, Tokihiro. / Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions. In: IEEE Conf. on Electr. Insul. and Diel. Phen. 2000 ; pp. 639-644.
@article{2b6408b734304c8cb519c660d42126f2,
title = "Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions",
author = "M.F. Frechette and C.Hudon C.Hudon and M. Germain and R.Y.Larocque R.Y.Larocque and Satoshi Matsumoto and Tokihiro Umemura",
year = "2000",
month = "10",
day = "15",
language = "English",
pages = "639--644",
journal = "IEEE Conf. on Electr. Insul. and Diel. Phen.",

}

TY - JOUR

T1 - Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions

AU - Frechette, M.F.

AU - C.Hudon, C.Hudon

AU - Germain, M.

AU - R.Y.Larocque, R.Y.Larocque

AU - Matsumoto, Satoshi

AU - Umemura, Tokihiro

PY - 2000/10/15

Y1 - 2000/10/15

M3 - Article

SP - 639

EP - 644

JO - IEEE Conf. on Electr. Insul. and Diel. Phen.

JF - IEEE Conf. on Electr. Insul. and Diel. Phen.

ER -