PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations

Atsushi Sakai, Shigeru Yamada, Takashi Kariya, Shiro Uchiyama, Hiroaki Ikeda, Haruya Fujita, Hiroki Takatani, Yosuke Tanaka, Yoshiaki Oizono, Yoshitaka Nabeshima, Toshio Sudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The 4096 bits wide-bus three-dimensional integration device using through-silicon-vias (TSVs) has been designed and fabricated as a demonstrator for power integrity such as power distribution network (PDN) impedance and simultaneous switching output (SSO) noise characteristics. Anti-resonance peak of total PDN impedance was extracted at around 80 MHz. This result was well coincident with maximum SSO noise frequency at around 75 MHz. Further, SSO noise reduction clocking named phase-shift clock has also been implemented to demonstrate the effectiveness as measurement basis.

Original languageEnglish
Title of host publication2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012
DOIs
Publication statusPublished - 2012
Event2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012 - Kyoto
Duration: 2012 Dec 102012 Dec 12

Other

Other2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012
CityKyoto
Period12/12/1012/12/12

Fingerprint

Electric power distribution
Noise abatement
Acoustic noise
Phase shift
Clocks
Silicon
System-in-package

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Sakai, A., Yamada, S., Kariya, T., Uchiyama, S., Ikeda, H., Fujita, H., ... Sudo, T. (2012). PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations. In 2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012 [6523460] https://doi.org/10.1109/ICSJ.2012.6523460

PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations. / Sakai, Atsushi; Yamada, Shigeru; Kariya, Takashi; Uchiyama, Shiro; Ikeda, Hiroaki; Fujita, Haruya; Takatani, Hiroki; Tanaka, Yosuke; Oizono, Yoshiaki; Nabeshima, Yoshitaka; Sudo, Toshio.

2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012. 2012. 6523460.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sakai, A, Yamada, S, Kariya, T, Uchiyama, S, Ikeda, H, Fujita, H, Takatani, H, Tanaka, Y, Oizono, Y, Nabeshima, Y & Sudo, T 2012, PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations. in 2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012., 6523460, 2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012, Kyoto, 12/12/10. https://doi.org/10.1109/ICSJ.2012.6523460
Sakai A, Yamada S, Kariya T, Uchiyama S, Ikeda H, Fujita H et al. PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations. In 2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012. 2012. 6523460 https://doi.org/10.1109/ICSJ.2012.6523460
Sakai, Atsushi ; Yamada, Shigeru ; Kariya, Takashi ; Uchiyama, Shiro ; Ikeda, Hiroaki ; Fujita, Haruya ; Takatani, Hiroki ; Tanaka, Yosuke ; Oizono, Yoshiaki ; Nabeshima, Yoshitaka ; Sudo, Toshio. / PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations. 2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012. 2012.
@inproceedings{ef7a1d0542b941b089a241b7bd33706b,
title = "PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations",
abstract = "The 4096 bits wide-bus three-dimensional integration device using through-silicon-vias (TSVs) has been designed and fabricated as a demonstrator for power integrity such as power distribution network (PDN) impedance and simultaneous switching output (SSO) noise characteristics. Anti-resonance peak of total PDN impedance was extracted at around 80 MHz. This result was well coincident with maximum SSO noise frequency at around 75 MHz. Further, SSO noise reduction clocking named phase-shift clock has also been implemented to demonstrate the effectiveness as measurement basis.",
author = "Atsushi Sakai and Shigeru Yamada and Takashi Kariya and Shiro Uchiyama and Hiroaki Ikeda and Haruya Fujita and Hiroki Takatani and Yosuke Tanaka and Yoshiaki Oizono and Yoshitaka Nabeshima and Toshio Sudo",
year = "2012",
doi = "10.1109/ICSJ.2012.6523460",
language = "English",
isbn = "9781467326551",
booktitle = "2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012",

}

TY - GEN

T1 - PDN characteristics of 3D-SiP with a wide-bus structure under 4k-IO operations

AU - Sakai, Atsushi

AU - Yamada, Shigeru

AU - Kariya, Takashi

AU - Uchiyama, Shiro

AU - Ikeda, Hiroaki

AU - Fujita, Haruya

AU - Takatani, Hiroki

AU - Tanaka, Yosuke

AU - Oizono, Yoshiaki

AU - Nabeshima, Yoshitaka

AU - Sudo, Toshio

PY - 2012

Y1 - 2012

N2 - The 4096 bits wide-bus three-dimensional integration device using through-silicon-vias (TSVs) has been designed and fabricated as a demonstrator for power integrity such as power distribution network (PDN) impedance and simultaneous switching output (SSO) noise characteristics. Anti-resonance peak of total PDN impedance was extracted at around 80 MHz. This result was well coincident with maximum SSO noise frequency at around 75 MHz. Further, SSO noise reduction clocking named phase-shift clock has also been implemented to demonstrate the effectiveness as measurement basis.

AB - The 4096 bits wide-bus three-dimensional integration device using through-silicon-vias (TSVs) has been designed and fabricated as a demonstrator for power integrity such as power distribution network (PDN) impedance and simultaneous switching output (SSO) noise characteristics. Anti-resonance peak of total PDN impedance was extracted at around 80 MHz. This result was well coincident with maximum SSO noise frequency at around 75 MHz. Further, SSO noise reduction clocking named phase-shift clock has also been implemented to demonstrate the effectiveness as measurement basis.

UR - http://www.scopus.com/inward/record.url?scp=84879767689&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84879767689&partnerID=8YFLogxK

U2 - 10.1109/ICSJ.2012.6523460

DO - 10.1109/ICSJ.2012.6523460

M3 - Conference contribution

AN - SCOPUS:84879767689

SN - 9781467326551

BT - 2012 2nd IEEE CPMT Symposium Japan, ICSJ 2012

ER -