Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors

Muralidhar Miryala, Naomichi Sakai, M. Nishiyama, M. Jirsa, T. Machi, Masato Murakami

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Abstract

The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.

Original languageEnglish
Pages (from-to)943-945
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number6
DOIs
Publication statusPublished - 2003 Feb 10
Externally publishedYes

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  • Physics and Astronomy (miscellaneous)

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Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors. / Miryala, Muralidhar; Sakai, Naomichi; Nishiyama, M.; Jirsa, M.; Machi, T.; Murakami, Masato.

In: Applied Physics Letters, Vol. 82, No. 6, 10.02.2003, p. 943-945.

Research output: Contribution to journalArticle

@article{a996bb43ed904c0f8b69110eb0f4d006,
title = "Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors",
abstract = "The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.",
author = "Muralidhar Miryala and Naomichi Sakai and M. Nishiyama and M. Jirsa and T. Machi and Masato Murakami",
year = "2003",
month = "2",
day = "10",
doi = "10.1063/1.1542927",
language = "English",
volume = "82",
pages = "943--945",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "6",

}

TY - JOUR

T1 - Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors

AU - Miryala, Muralidhar

AU - Sakai, Naomichi

AU - Nishiyama, M.

AU - Jirsa, M.

AU - Machi, T.

AU - Murakami, Masato

PY - 2003/2/10

Y1 - 2003/2/10

N2 - The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.

AB - The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.

UR - http://www.scopus.com/inward/record.url?scp=0037428790&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037428790&partnerID=8YFLogxK

U2 - 10.1063/1.1542927

DO - 10.1063/1.1542927

M3 - Article

AN - SCOPUS:0037428790

VL - 82

SP - 943

EP - 945

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 6

ER -