Pinning force scaling of electrospun Bi-2212 nanowire networks

Michael Rudolf Koblischka, Denis Gokhfeld, Crosby Chang, Thomas Hauet, Uwe Hartmann

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Flux pinning forces were determined on different network samples of superconducting Bi2Sr2CaCu2O8 (Bi-2212) nanowires prepared by the electrospinning technique. We employed magnetization data determined by SQUID magnetometry in a wide temperature range 10 K <T< 35 K, where a strong superconducting signal prevails. The scaling analysis of the pinning forces was applied to interprete the data obtained. Both pure and Li-doped Bi2212 nanowire networks exhibit a peak position of h0∼ 0.11, which is smaller than the expected value of h0= 0.2 indicating flux pinning at grain boundaries or extended defects. For the flowing currents through such a network, the crystallographic anisotropy and the percolation play an important role, resulting in reduced peak positions as compared to bulk samples.

Original languageEnglish
Pages (from-to)16-18
Number of pages3
JournalSolid State Communications
Volume264
DOIs
Publication statusPublished - 2017 Sep 1
Externally publishedYes

Fingerprint

Flux pinning
Nanowires
nanowires
flux pinning
scaling
SQUIDs
Electrospinning
Magnetization
Grain boundaries
Anisotropy
Defects
magnetic measurement
grain boundaries
magnetization
anisotropy
defects
Temperature
temperature
Magnetometry

Keywords

  • A. Bi-2212 superconductors
  • B. Electrospinning
  • D. Flux pinning
  • D. Pinning force scaling

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Pinning force scaling of electrospun Bi-2212 nanowire networks. / Koblischka, Michael Rudolf; Gokhfeld, Denis; Chang, Crosby; Hauet, Thomas; Hartmann, Uwe.

In: Solid State Communications, Vol. 264, 01.09.2017, p. 16-18.

Research output: Contribution to journalArticle

Koblischka, Michael Rudolf ; Gokhfeld, Denis ; Chang, Crosby ; Hauet, Thomas ; Hartmann, Uwe. / Pinning force scaling of electrospun Bi-2212 nanowire networks. In: Solid State Communications. 2017 ; Vol. 264. pp. 16-18.
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