Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi; M. Shimojo; M. Tanaka; M. Mitsuishi; R. Che; W. Zhang; K. Furuya

Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi, M. Shimojo, M. Tanaka, M. Mitsuishi, R. Che, W. Zhang, K. Furuya

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Digest of Papers - Microprocesses and Nanotechnology 2005
Subtitle of host publication	2005 International Microprocesses and Nanotechnology Conference
Pages	232-233
Number of pages	2
Publication status	Published - 2005 Dec 1
Externally published	Yes
Event	2005 International Microprocesses and Nanotechnology Conference - Tokyo, Japan Duration: 2005 Oct 25 → 2005 Oct 28

Publication series

Name	Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
Volume	2005

Conference

Conference	2005 International Microprocesses and Nanotechnology Conference
Country	Japan
City	Tokyo
Period	05/10/25 → 05/10/28

ASJC Scopus subject areas

Engineering(all)

Access to Document

Cite this

Takeguchi, M., Shimojo, M., Tanaka, M., Mitsuishi, M., Che, R., Zhang, W., & Furuya, K. (2005). Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (pp. 232-233). [1595299] (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference; Vol. 2005).

Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. / Takeguchi, M.; Shimojo, M.; Tanaka, M.; Mitsuishi, M.; Che, R.; Zhang, W.; Furuya, K.

Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 2005. p. 232-233 1595299 (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Takeguchi, M, Shimojo, M, Tanaka, M, Mitsuishi, M, Che, R, Zhang, W & Furuya, K 2005, Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. in Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference., 1595299, Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference, vol. 2005, pp. 232-233, 2005 International Microprocesses and Nanotechnology Conference, Tokyo, Japan, 05/10/25.

Takeguchi M, Shimojo M, Tanaka M, Mitsuishi M, Che R, Zhang W et al. Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 2005. p. 232-233. 1595299. (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference).

Takeguchi, M. ; Shimojo, M. ; Tanaka, M. ; Mitsuishi, M. ; Che, R. ; Zhang, W. ; Furuya, K. / Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 2005. pp. 232-233 (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference).

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AU - Shimojo, M.

AU - Tanaka, M.

AU - Mitsuishi, M.

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AU - Zhang, W.

AU - Furuya, K.

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