Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi, Masayuki Shimojo, M. Tanaka, M. Mitsuishi, R. Che, W. Zhang, K. Furuya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
Pages232-233
Number of pages2
Volume2005
Publication statusPublished - 2005
Externally publishedYes
Event2005 International Microprocesses and Nanotechnology Conference - Tokyo
Duration: 2005 Oct 252005 Oct 28

Other

Other2005 International Microprocesses and Nanotechnology Conference
CityTokyo
Period05/10/2505/10/28

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Nanorods
Electron beams

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Takeguchi, M., Shimojo, M., Tanaka, M., Mitsuishi, M., Che, R., Zhang, W., & Furuya, K. (2005). Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (Vol. 2005, pp. 232-233). [1595299]

Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. / Takeguchi, M.; Shimojo, Masayuki; Tanaka, M.; Mitsuishi, M.; Che, R.; Zhang, W.; Furuya, K.

Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. Vol. 2005 2005. p. 232-233 1595299.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takeguchi, M, Shimojo, M, Tanaka, M, Mitsuishi, M, Che, R, Zhang, W & Furuya, K 2005, Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. in Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. vol. 2005, 1595299, pp. 232-233, 2005 International Microprocesses and Nanotechnology Conference, Tokyo, 05/10/25.
Takeguchi M, Shimojo M, Tanaka M, Mitsuishi M, Che R, Zhang W et al. Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. Vol. 2005. 2005. p. 232-233. 1595299
Takeguchi, M. ; Shimojo, Masayuki ; Tanaka, M. ; Mitsuishi, M. ; Che, R. ; Zhang, W. ; Furuya, K. / Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. Vol. 2005 2005. pp. 232-233
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