Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi, M. Shimojo, M. Tanaka, M. Mitsuishi, R. Che, W. Zhang, K. Furuya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 2005
Subtitle of host publication2005 International Microprocesses and Nanotechnology Conference
Pages232-233
Number of pages2
Publication statusPublished - 2005 Dec 1
Event2005 International Microprocesses and Nanotechnology Conference - Tokyo, Japan
Duration: 2005 Oct 252005 Oct 28

Publication series

NameDigest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
Volume2005

Conference

Conference2005 International Microprocesses and Nanotechnology Conference
CountryJapan
CityTokyo
Period05/10/2505/10/28

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Takeguchi, M., Shimojo, M., Tanaka, M., Mitsuishi, M., Che, R., Zhang, W., & Furuya, K. (2005). Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (pp. 232-233). [1595299] (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference; Vol. 2005).