Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi, Masayuki Shimojo, M. Tanaka, M. Mitsuishi, R. Che, W. Zhang, K. Furuya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
Pages232-233
Number of pages2
Volume2005
Publication statusPublished - 2005
Externally publishedYes
Event2005 International Microprocesses and Nanotechnology Conference - Tokyo
Duration: 2005 Oct 252005 Oct 28

Other

Other2005 International Microprocesses and Nanotechnology Conference
CityTokyo
Period05/10/2505/10/28

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Takeguchi, M., Shimojo, M., Tanaka, M., Mitsuishi, M., Che, R., Zhang, W., & Furuya, K. (2005). Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (Vol. 2005, pp. 232-233). [1595299]