Prediction and verification of no gate orientation effects for GaAs MESFETs in (111) substrates

K.Ueno K.Ueno, H.Hida H.Hida, Y.Ogawa Y.Ogawa, Y.Tsukada Y.Tsukada, T.Nozaki T.Nozaki, Kazuyoshi Ueno

Research output: Contribution to journalArticle

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)846-849
Journal1988 IEDM Technical Digest
Publication statusPublished - 1988 Dec 1

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K.Ueno, K. U., H.Hida, H. H., Y.Ogawa, Y. O., Y.Tsukada, Y. T., T.Nozaki, T. N., & Ueno, K. (1988). Prediction and verification of no gate orientation effects for GaAs MESFETs in (111) substrates. 1988 IEDM Technical Digest, 846-849.