Properties of HTS for successful U/n processing

R. Weinstein, Y. Ren, R. Sawh, A. Gandini, W. Hennig, M. Murakami, T. Mochida, N. Chikumoto, N. Sakai, G. Krabbes, W. Bieger, D. Milliken, S. X. Dou, S. Tönies, M. Eisterer, H. W. Weber

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