Abstract
This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.
Original language | English |
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Pages (from-to) | 3195-3199 |
Number of pages | 5 |
Journal | IEICE Transactions on Communications |
Volume | E88-B |
Issue number | 8 |
DOIs | |
Publication status | Published - 2005 Aug |
Keywords
- Core circuit
- On-chip decoupling capacitor
- Output buffer circuit
- Radiated emission
- Simultaneous switching noise
- Test chip
ASJC Scopus subject areas
- Software
- Computer Networks and Communications
- Electrical and Electronic Engineering