Radiated harmonics characterization of CMOS test chip with on-chip decoupling capacitance

Toshio Sudo

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.

Original languageEnglish
Pages (from-to)3195-3199
Number of pages5
JournalIEICE Transactions on Communications
VolumeE88-B
Issue number8
DOIs
Publication statusPublished - 2005 Aug

Fingerprint

Capacitance
Buffer circuits
Logic circuits
Field emission
Noise generators
Chip scale packages

Keywords

  • Core circuit
  • On-chip decoupling capacitor
  • Output buffer circuit
  • Radiated emission
  • Simultaneous switching noise
  • Test chip

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Networks and Communications

Cite this

Radiated harmonics characterization of CMOS test chip with on-chip decoupling capacitance. / Sudo, Toshio.

In: IEICE Transactions on Communications, Vol. E88-B, No. 8, 08.2005, p. 3195-3199.

Research output: Contribution to journalArticle

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