Raman scattering study on fractal structures in YSZ

H. Yugami, Shigeki Matsuo, M. Ishigame

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Low-frequency Raman scattering spectra in yttria-stabilized zirconia (YSZ) were measured on several samples with different compositions. It is found that the frequency dependence of the Raman intensity can be represented by two straight lines with different slopes on a log-log scale. Since the slope in the lower-frequency region obeys a ω4 law, the region below the crossover frequency ωco is assigned to the "phonon region". On the other hand, Raman spectra above ωco cannot be explained by a Debye model, but can be interpreted in terms of a fracton model. The fractal and fracton dimensionalities are estimated in this system.

Original languageEnglish
Pages (from-to)1264-1268
Number of pages5
JournalSolid State Ionics
Volume53-56
Issue numberPART 2
DOIs
Publication statusPublished - 1992
Externally publishedYes

Fingerprint

Yttria stabilized zirconia
yttria-stabilized zirconia
Fractals
Raman scattering
fractals
Raman spectra
slopes
low frequencies
crossovers
Chemical analysis

ASJC Scopus subject areas

  • Electrochemistry
  • Physical and Theoretical Chemistry
  • Energy Engineering and Power Technology
  • Materials Chemistry
  • Condensed Matter Physics

Cite this

Raman scattering study on fractal structures in YSZ. / Yugami, H.; Matsuo, Shigeki; Ishigame, M.

In: Solid State Ionics, Vol. 53-56, No. PART 2, 1992, p. 1264-1268.

Research output: Contribution to journalArticle

Yugami, H. ; Matsuo, Shigeki ; Ishigame, M. / Raman scattering study on fractal structures in YSZ. In: Solid State Ionics. 1992 ; Vol. 53-56, No. PART 2. pp. 1264-1268.
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