Recent advances in magnetic force microscopy

Research output: Contribution to journalArticle

56 Citations (Scopus)

Abstract

During the past ten years magnetic force microscopy (MFM) has become probably the most powerful general-purpose method for magnetic imaging. MFM can be applied under various environmental conditions and requires only little sample preparation. Basic research on magnetic materials as well as the mentioned industrial applications create an increasing demand for high-resolution magnetic imaging methods. This contribution will review some new concepts which have been realized in the field of advanced probe preparation, based on electron beam methods in order to improve the spatial resolution beyond 100nm. It is shown that the advanced probes allow high-resolution imaging of magnetic fine structures within thin film permalloy elements exhibiting a complicated cooperative magnetization reversal process. These investigations are of importance for various concepts underlying modern magnetic data storage developments. Furthermore, we present some developments of MFM to suit the needs of the magnetic recording industry.

Original languageEnglish
Pages (from-to)103-112
Number of pages10
JournalUltramicroscopy
Volume97
Issue number1-4
DOIs
Publication statusPublished - 2003 Jan 1
Externally publishedYes

Fingerprint

Magnetic force microscopy
magnetic force microscopy
Imaging techniques
Magnetic storage
Magnetization reversal
preparation
Magnetic recording
probes
high resolution
Magnetic materials
Permalloys (trademark)
magnetic recording
data storage
magnetic materials
Industrial applications
Electron beams
spatial resolution
fine structure
industries
electron beams

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Recent advances in magnetic force microscopy. / Koblischka, Michael Rudolf; Hartmann, U.

In: Ultramicroscopy, Vol. 97, No. 1-4, 01.01.2003, p. 103-112.

Research output: Contribution to journalArticle

Koblischka, Michael Rudolf ; Hartmann, U. / Recent advances in magnetic force microscopy. In: Ultramicroscopy. 2003 ; Vol. 97, No. 1-4. pp. 103-112.
@article{5352e3b6a57e45df8d33ed4a5d2f3d66,
title = "Recent advances in magnetic force microscopy",
abstract = "During the past ten years magnetic force microscopy (MFM) has become probably the most powerful general-purpose method for magnetic imaging. MFM can be applied under various environmental conditions and requires only little sample preparation. Basic research on magnetic materials as well as the mentioned industrial applications create an increasing demand for high-resolution magnetic imaging methods. This contribution will review some new concepts which have been realized in the field of advanced probe preparation, based on electron beam methods in order to improve the spatial resolution beyond 100nm. It is shown that the advanced probes allow high-resolution imaging of magnetic fine structures within thin film permalloy elements exhibiting a complicated cooperative magnetization reversal process. These investigations are of importance for various concepts underlying modern magnetic data storage developments. Furthermore, we present some developments of MFM to suit the needs of the magnetic recording industry.",
author = "Koblischka, {Michael Rudolf} and U. Hartmann",
year = "2003",
month = "1",
day = "1",
doi = "10.1016/S0304-3991(03)00034-2",
language = "English",
volume = "97",
pages = "103--112",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "1-4",

}

TY - JOUR

T1 - Recent advances in magnetic force microscopy

AU - Koblischka, Michael Rudolf

AU - Hartmann, U.

PY - 2003/1/1

Y1 - 2003/1/1

N2 - During the past ten years magnetic force microscopy (MFM) has become probably the most powerful general-purpose method for magnetic imaging. MFM can be applied under various environmental conditions and requires only little sample preparation. Basic research on magnetic materials as well as the mentioned industrial applications create an increasing demand for high-resolution magnetic imaging methods. This contribution will review some new concepts which have been realized in the field of advanced probe preparation, based on electron beam methods in order to improve the spatial resolution beyond 100nm. It is shown that the advanced probes allow high-resolution imaging of magnetic fine structures within thin film permalloy elements exhibiting a complicated cooperative magnetization reversal process. These investigations are of importance for various concepts underlying modern magnetic data storage developments. Furthermore, we present some developments of MFM to suit the needs of the magnetic recording industry.

AB - During the past ten years magnetic force microscopy (MFM) has become probably the most powerful general-purpose method for magnetic imaging. MFM can be applied under various environmental conditions and requires only little sample preparation. Basic research on magnetic materials as well as the mentioned industrial applications create an increasing demand for high-resolution magnetic imaging methods. This contribution will review some new concepts which have been realized in the field of advanced probe preparation, based on electron beam methods in order to improve the spatial resolution beyond 100nm. It is shown that the advanced probes allow high-resolution imaging of magnetic fine structures within thin film permalloy elements exhibiting a complicated cooperative magnetization reversal process. These investigations are of importance for various concepts underlying modern magnetic data storage developments. Furthermore, we present some developments of MFM to suit the needs of the magnetic recording industry.

UR - http://www.scopus.com/inward/record.url?scp=0038204148&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0038204148&partnerID=8YFLogxK

U2 - 10.1016/S0304-3991(03)00034-2

DO - 10.1016/S0304-3991(03)00034-2

M3 - Article

C2 - 12801662

AN - SCOPUS:0038204148

VL - 97

SP - 103

EP - 112

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 1-4

ER -