Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes

Dan Lei, Kazutaka Mitsuishi, Masayuki Shimojo, Masaki Takeguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Phase-shifting electron holography is a transmission electron microscope technique that a number of holograms with different initial phases are acquired by changing the angle of the incident electron beam, and the intensity variation at a certain point on the holograms is fitted by sinusoidal curve to retrieve the object wave passing through a specimen. In reality, however, Fresnel fringes caused by the electrostatic biprism modulates the electron wave, limits the fitting accuracy and results in phase errors in phase reconstruction. In this study, we suggest a modified phase reconstruction method for phase-shifting electron holography. The intensity variations at a certain point on each hologram are fitted not by sinusoidal curve, but by Fresnel diffraction affected curve to retrieve the object wave. This would provide better fitting accuracy, and has a potential to improve the precision of phase-shifting electron holography. Simulations demonstrated the improvements of this method comparing with conventional phase-shifting holography method.

Original languageEnglish
Title of host publicationApplied Materials and Technologies
PublisherTrans Tech Publications Ltd
Pages215-221
Number of pages7
Volume833
ISBN (Print)9783038355960
DOIs
Publication statusPublished - 2015
Event9th International Forum on Advanced Material Science and Technology, IFAMST9 2014 - Xiamen, China
Duration: 2014 Nov 302014 Dec 3

Publication series

NameMaterials Science Forum
Volume833
ISSN (Print)02555476

Other

Other9th International Forum on Advanced Material Science and Technology, IFAMST9 2014
CountryChina
CityXiamen
Period14/11/3014/12/3

Fingerprint

Electron holography
Fresnel diffraction
Holograms
holography
Diffraction
electrons
curves
Holography
Electrostatics
Electron beams
phase error
Electron microscopes
Electrons
electron microscopes
electron beams
electrostatics
simulation

Keywords

  • Fresnel fringes
  • Phase measurement
  • Phase-shifting electron holography
  • Reconstruction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Lei, D., Mitsuishi, K., Shimojo, M., & Takeguchi, M. (2015). Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes. In Applied Materials and Technologies (Vol. 833, pp. 215-221). (Materials Science Forum; Vol. 833). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.833.215

Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes. / Lei, Dan; Mitsuishi, Kazutaka; Shimojo, Masayuki; Takeguchi, Masaki.

Applied Materials and Technologies. Vol. 833 Trans Tech Publications Ltd, 2015. p. 215-221 (Materials Science Forum; Vol. 833).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lei, D, Mitsuishi, K, Shimojo, M & Takeguchi, M 2015, Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes. in Applied Materials and Technologies. vol. 833, Materials Science Forum, vol. 833, Trans Tech Publications Ltd, pp. 215-221, 9th International Forum on Advanced Material Science and Technology, IFAMST9 2014, Xiamen, China, 14/11/30. https://doi.org/10.4028/www.scientific.net/MSF.833.215
Lei D, Mitsuishi K, Shimojo M, Takeguchi M. Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes. In Applied Materials and Technologies. Vol. 833. Trans Tech Publications Ltd. 2015. p. 215-221. (Materials Science Forum). https://doi.org/10.4028/www.scientific.net/MSF.833.215
Lei, Dan ; Mitsuishi, Kazutaka ; Shimojo, Masayuki ; Takeguchi, Masaki. / Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes. Applied Materials and Technologies. Vol. 833 Trans Tech Publications Ltd, 2015. pp. 215-221 (Materials Science Forum).
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