TY - GEN
T1 - Reference Model of specifications toward Independent Verification and Validation
AU - Ando, Takahiro
AU - Yatsu, Hirokazu
AU - Hisazumi, Kenji
AU - Fukuda, Akira
AU - Matsumoto, Michihiro
AU - Michiura, Yasutaka
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/5
Y1 - 2016/1/5
N2 - Independent Verification and Validation (IV&V) [1] has begun to be used in the verification phase of system development. In this paper, we present the document group which we call Reference Model that we are developing currently. The Reference Model is developed for the purpose of supporting the efficient implementation of the formal verification for requirements and design specifications in IV&V. The Reference Model shows what with formats the requirement and design specifications should be described. For developers side of IV&V, the Reference Model are useful to recognize the essential information and its notation that should be described in the document that is a target of formal verification. For verifiers side, by comparing the Reference Model and the target document of the formal verification, the Reference Models are useful to recognize which items and properties should be verified.
AB - Independent Verification and Validation (IV&V) [1] has begun to be used in the verification phase of system development. In this paper, we present the document group which we call Reference Model that we are developing currently. The Reference Model is developed for the purpose of supporting the efficient implementation of the formal verification for requirements and design specifications in IV&V. The Reference Model shows what with formats the requirement and design specifications should be described. For developers side of IV&V, the Reference Model are useful to recognize the essential information and its notation that should be described in the document that is a target of formal verification. For verifiers side, by comparing the Reference Model and the target document of the formal verification, the Reference Models are useful to recognize which items and properties should be verified.
UR - http://www.scopus.com/inward/record.url?scp=84962140507&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84962140507&partnerID=8YFLogxK
U2 - 10.1109/TENCON.2015.7372818
DO - 10.1109/TENCON.2015.7372818
M3 - Conference contribution
AN - SCOPUS:84962140507
T3 - IEEE Region 10 Annual International Conference, Proceedings/TENCON
BT - TENCON 2015 - 2015 IEEE Region 10 Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 35th IEEE Region 10 Conference, TENCON 2015
Y2 - 1 November 2015 through 4 November 2015
ER -