Refractive index measurements of CaF2 single crystal and melt by ellipsometry

Shakhawat H. Firoz, Takashi Sakamaki, Rie Kojima Endo, Masahiro Susa

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Refractive indices of CaF2 have been determined by ellipsometry and factors determining the temperature dependence are discussed. Measurements were made on CaF2 single crystal and melt in dehydrated helium atmosphere in the temperature ranges from room temperature to 1050K and from 1600K to 1800 K, respectively. The standard deviation in the measured refractive indices was within ±0.001. The following equations were fitted to the measured refractive indices: Single crystal: n = n298 - 1.541 x 10 -5(T/K - 298) 298K - 1050K, melt: n = n1600 - 4.667 x 10-5(T/K - 1600) 1600K - 1800K, where n298 = 1.429 and n1600 = 1.409. It is likely that the temperature coefficients are determined predominantly by those of the densities.

Original languageEnglish
Pages (from-to)163-173
Number of pages11
JournalHigh Temperatures - High Pressures
Volume37
Issue number2
Publication statusPublished - 2008
Externally publishedYes

Keywords

  • CaF single crystal and melt
  • Ellipsometry and molar electronic polarisability
  • Refractive index

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

Fingerprint

Dive into the research topics of 'Refractive index measurements of CaF2 single crystal and melt by ellipsometry'. Together they form a unique fingerprint.

Cite this