Relationship between critical current properties and nanorod morphology in REBa2Cu3Oy, thin films

M. Haruta, N. Fujita, Y. Ogura, T. Nakata, T. Maeda, A. Ichinose, P. Mele, K. Matsumoto, S. Horii

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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