Abstract
Homoepitaxies and heteroepitaxies of Au and Ag were examined by means of RHEED intensity oscillation. The surface reconstruction of Au was found to influence the damping of the RHEED oscillations. We have also performed the RHEED observations during the growth of Au/Co multilayers at some temperatures. Samples grown at lower temperatures have smoother interface and show greater perpendicular magnetic anisotropy.
| Original language | English |
|---|---|
| Pages (from-to) | 235-239 |
| Number of pages | 5 |
| Journal | Microelectronic Engineering |
| Volume | 25 |
| Issue number | 2-4 |
| DOIs | |
| Publication status | Published - 1994 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Surfaces, Coatings and Films
- Atomic and Molecular Physics, and Optics
Cite this
RHEED investigation of metal epitaxies and multilayers. / Mae, K.; Kyuno, Kentaro; Kaneko, T.; Yamamoto, R.
In: Microelectronic Engineering, Vol. 25, No. 2-4, 1994, p. 235-239.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - RHEED investigation of metal epitaxies and multilayers
AU - Mae, K.
AU - Kyuno, Kentaro
AU - Kaneko, T.
AU - Yamamoto, R.
PY - 1994
Y1 - 1994
N2 - Homoepitaxies and heteroepitaxies of Au and Ag were examined by means of RHEED intensity oscillation. The surface reconstruction of Au was found to influence the damping of the RHEED oscillations. We have also performed the RHEED observations during the growth of Au/Co multilayers at some temperatures. Samples grown at lower temperatures have smoother interface and show greater perpendicular magnetic anisotropy.
AB - Homoepitaxies and heteroepitaxies of Au and Ag were examined by means of RHEED intensity oscillation. The surface reconstruction of Au was found to influence the damping of the RHEED oscillations. We have also performed the RHEED observations during the growth of Au/Co multilayers at some temperatures. Samples grown at lower temperatures have smoother interface and show greater perpendicular magnetic anisotropy.
UR - http://www.scopus.com/inward/record.url?scp=0028480044&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0028480044&partnerID=8YFLogxK
U2 - 10.1016/0167-9317(94)90021-3
DO - 10.1016/0167-9317(94)90021-3
M3 - Article
AN - SCOPUS:0028480044
VL - 25
SP - 235
EP - 239
JO - Microelectronic Engineering
JF - Microelectronic Engineering
SN - 0167-9317
IS - 2-4
ER -